Inventor
Ralph G. Whitten
Inventor
San Jose, CA, US
Overview
Patents· 29 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1034%
G01RMeasuring electric variables23%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1016%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
H05KPrinted circuits7%
G08BSignalling systems, e.g. personal calling systems5%
G02BOptical elements, systems or apparatus2%
H03KPulse technique2%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests2%
PatentTitleYear
10,724,976Systems and methods for determining at least one property of a material202010,453,321Pre-smoke detector and system for use in early detection of developing fires20199,922,517'Pre-smoke detector and system for use in early detection of developing fires'20189,625,401'Molecular analysis using micro electro-mechanical sensor devices'20179,547,968'Pre-smoke detector and system for use in early detection of developing fires'20177,557,596'Test assembly including a test die for testing a semiconductor product die'20097,053,637'Method for testing signal paths between an integrated circuit wafer and a wafer tester'20066,940,093'Special contact points for accessing internal circuitry of an integrated circuit'20056,825,052'Test assembly including a test die for testing a semiconductor product die'20046,724,209'Method for testing signal paths between an integrated circuit wafer and a wafer tester'20046,690,185'Large contactor with multiple, aligned contactor units'20046,621,260'Special contact points for accessing internal circuitry of an integrated circuit'20036,603,324'Special contact points for accessing internal circuitry of an integrated circuit'20036,597,187'Special contact points for accessing internal circuitry of an integrated circuit'20036,551,844'Test assembly including a test die for testing a semiconductor product die'20036,476,630'Method for testing signal paths between an integrated circuit wafer and a wafer tester'20026,456,099'Special contact points for accessing internal circuitry of an integrated circuit'20026,429,029'Concurrent design and subsequent partitioning of product and test die'20026,150,199'Method for fabrication of programmable interconnect structure'20005,989,943'Method for fabrication of programmable interconnect structure'19995,903,041'Integrated two-terminal fuse-antifuse and fuse and integrated two-terminal fuse-antifuse structures incorporating an air gap'19995,780,919'Electrically programmable interconnect structure having a PECVD amorphous silicon element'19985,717,230'Field programmable gate array having reproducible metal-to-metal amorphous silicon antifuses'19985,661,592'Method of making and an apparatus for a flat diffraction grating light valve'19975,502,315'Electrically programmable interconnect structure having a PECVD amorphous silicon element'19965,451,811'Electrically programmable interconnect element for integrated circuits'19955,412,261'Two-stage programmable interconnect architecture'19955,341,267'Structures for electrostatic discharge protection of electrical and other components'19944,796,075'Fusible link structure for integrated circuits'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2009Based in San Jose, CA, US· patent location history
1994–1999Patents assigned to APTIX CORP (4)· patent assignee history
1996–2000Patents assigned to QUICKLOGIC CORP (5)· patent assignee history
2002–2009Patents assigned to FORMFACTOR INC (12)· patent assignee history
2017–2020Patents assigned to NEVADA NANOTECH SYSTEMS INC (5)· patent assignee history
2017Patents assigned to ADAMS JESSE D (1)· patent assignee history
2017Based in Truckee, CA, US· patent location history
2017Based in Sierraville, CA, US· patent location history
2018–2020Based in Reno, NV, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FORMFACTOR INC | 12 | 2002–2009 |
| NEVADA NANOTECH SYSTEMS INC | 5 | 2017–2020 |
| QUICKLOGIC CORP | 5 | 1996–2000 |
| APTIX CORP | 4 | 1994–1999 |
| ADAMS JESSE D | 1 | 2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 24 | 1989–2009 |
| Reno, NV, US | 3 | 2018–2020 |
| Truckee, California, US | 1 | 2017 |
| Sierraville, California, US | 1 | 2017 |