Inventor
HUNG-CHAN LIN
Inventor
TW
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Bprimary
H10BElectronic memory devices36%
H10NElectric solid-state devices not otherwise provided for36%
G11CStatic stores13%
H01LSemiconductor devices4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
G01RMeasuring electric variables2%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices2%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h102%
PatentTitleYear
12,464,958Magnetoresistive random access memory (MRAM) device and method of forming the same202512,439,832Semiconductor device and method for fabricating the same202512,437,790Semiconductor structure and manufacturing method thereof202512,389,808Semiconductor device and method for fabricating the same202512,369,499Magnetoresistive random access memory and method of manufacturing the same202512,317,512SOT MRAM structure and fabricating method of the same202512,310,259Semiconductor device and method for fabricating the same202512,262,544Magnetoresistive random access memory and method for fabricating the same202512,256,556Magnetoresistive random access memory and method for fabricating the same202512,190,926Layout pattern of magnetoresistive random access memory202512,089,508Semiconductor device and method for fabricating the same202411,968,910Semiconductor device and method for fabricating the same202411,968,911Semiconductor device and method for fabricating the same202411,956,973Magnetoresistive random access memory and method for fabricating the same202411,944,016Magnetoresistive random access memory and method of manufacturing the same202411,335,729Semiconductor memory device202211,309,486Magnetoresistive random access memory with larger alignment window and method of manufacturing the same202211,300,611Image test system and test assembly thereof2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to UNITED MICROELECTRONICS CORP (17)· patent assignee history
2022Patents assigned to KING YUAN ELECTRONICS CO LTD (1)· patent assignee history
2022–2025Based in TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNITED MICROELECTRONICS CORP | 17 | 2022–2025 |
| KING YUAN ELECTRONICS CO LTD | 1 | 2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| TW | 18 | 2022–2025 |