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Inventor

Mike Adel

Inventor
Zichron Yaakov, IL

Overview

13→
Patents
2001–2020
Patent span
Physics
Primary field (CPC G)

Patents· 13 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices21%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%
G01BMeasuring length, thickness or similar linear dimensions14%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%
H01LSemiconductor devices9%
G05BControl or regulating systems in general5%
A61BDiagnosis2%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
G06FElectric digital data processing2%
PatentTitleYear
10,649,447Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers202010,151,584Periodic patterns and technique to control misalignment between two layers20189,835,447Periodic patterns and technique to control misalignment between two layers20179,651,943'Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers'20179,476,698'Periodic patterns and technique to control misalignment between two layers'20169,234,745'Periodic patterns and techniques to control misalignment between two layers'20169,103,662'Periodic patterns and technique to control misalignment between two layers'20158,570,515'Periodic patterns and technique to control misalignment between two layers'20138,525,994'Periodic patterns and technique to control misaligment between two layers'20138,175,831'Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers'20127,925,486'Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout'20117,656,528'Periodic patterns and technique to control misalignment between two layers'20106,276,798'Spectral bio-imaging of the eye'2001

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2001–2020Based in Zichron Yaakov, IL· patent location history
2010–2020Patents assigned to KLA TENCOR CORP (11)· patent assignee history
2012–2017Patents assigned to ADEL MIKE (4)· patent assignee history
2012–2017Patents assigned to CHOI DONGSUB (2)· patent assignee history
2013Patents assigned to ABDULHALIM IBRAHIM (2)· patent assignee history
2013Patents assigned to FAEYRMAN MICHAEL (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KLA TENCOR CORP112010–2020
ADEL MIKEself42012–2017
ABDULHALIM IBRAHIM22013
CHOI DONGSUB22012–2017
FAEYRMAN MICHAEL22013
Locations
LocationPatentsSpan
Zichron Yaakov, IL132001–2020