Inventor
James C. Tsang
Inventor
White Plains, NY, US
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables32%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests18%
H10DInorganic electric semiconductor devices16%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1016%
B82YSpecific uses or applications of nanostructures5%
C01BNon-metallic elements2%
E21BEarth or rock drilling2%
G01NInvestigating or analysing materials by determining their chemical or physical properties2%
G01VGeophysics2%
H10KOrganic electric solid-state devices2%
PatentTitleYear
8,927,057'Graphene formation utilizing solid phase carbon sources'20157,791,087'Device for defeating reverse engineering of integrated circuits by optical means'20107,791,086'Device for defeating reverse engineering of integrated circuits by optical means'20107,781,782'Device for defeating reverse engineering of integrated circuits by optical means'20107,612,382'Method for defeating reverse engineering of integrated circuits by optical means'20097,577,233'Rotating X-ray apparatus for inspection of deployed intravascular devices'20097,399,992'Device for defeating reverse engineering of integrated circuits by optical means'20087,115,912'Device for defeating reverse engineering of integrated circuits by optical means'20067,115,916'System and method for molecular optical emission'20066,774,647'Noninvasive optical method and system for inspecting or testing CMOS circuits'20046,650,768'Using time resolved light emission from VLSI circuit devices for navigation on complex systems'20036,515,304'Device for defeating reverse engineering of integrated circuits by optical means'20036,496,022'Method and apparatus for reverse engineering integrated circuits by monitoring optical emission'20026,327,394'Apparatus and method for deriving temporal delays in integrated circuits'20016,304,668'Using time resolved light emission from VLSI circuit devices for navigation on complex systems'20016,172,512'Image processing methods for the optical detection of dynamic errors in integrated circuits'20016,028,952'System and method for compressing and analyzing time-resolved optical data obtained from operating integrated circuits'20005,940,545'Noninvasive optical method for measuring internal switching and other dynamic parameters of CMOS circuits'19995,278,758'Method and apparatus for nuclear logging using lithium detector assemblies and gamma ray stripping means'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994Patents assigned to BAKER HUGHES INC (1)· patent assignee history
1994Based in Manalapan, NJ, US· patent location history
1999–2015Patents assigned to IBM (16)· patent assignee history
1999–2010Based in White Plains, NY, US· patent location history
2009Based in Flanders, NJ, US· patent location history
2015Patents assigned to BOL AGEETH A (1)· patent assignee history
2015Patents assigned to CARRUTHERS ROY A (1)· patent assignee history
2015Patents assigned to CHU JACK O (1)· patent assignee history
2015Based in Yorktown Heights, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 16 | 1999–2015 |
| BAKER HUGHES INC | 1 | 1994 |
| BOL AGEETH A | 1 | 2015 |
| CARRUTHERS ROY A | 1 | 2015 |
| CHU JACK O | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| White Plains, New York, US | 16 | 1999–2010 |
| Yorktown Heights, New York, US | 1 | 2015 |
| Flanders, New Jersey, US | 1 | 2009 |
| Manalapan, New Jersey, US | 1 | 1994 |