Inventor
Douglas S. Dewey
Inventor
Highgate, VT, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables31%
G05BControl or regulating systems in general25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%
H01LSemiconductor devices13%
G11CStatic stores6%
Y02PClimate change mitigation technologies in the production or processing of goods6%
PatentTitleYear
10,168,685Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies201910,162,325Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies20189,506,977'Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studies'20169,429,619'Reliability test screen optimization'20169,310,426'On-going reliability monitoring of integrated circuit chips in the field'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016–2019Patents assigned to IBM (4)· patent assignee history
2016Patents assigned to GLOBALFOUNDRIES INC (2)· patent assignee history
2016Patents assigned to ANEMIKOS THEODOROS E (1)· patent assignee history
2016Patents assigned to BICKFORD JEANNE P (1)· patent assignee history
2016Patents assigned to DEWEY DOUGLAS S (1)· patent assignee history
2016–2019Based in Highgate, VT, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 4 | 2016–2019 |
| GLOBALFOUNDRIES INC | 2 | 2016 |
| ANEMIKOS THEODOROS E | 1 | 2016 |
| BICKFORD JEANNE P | 1 | 2016 |
| DEWEY DOUGLAS Sself | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Highgate, VT, US | 5 | 2016–2019 |