Inventor
Kanak B. Agarwal
Inventor
Austin, TX, US
Overview
Patents· 116 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Lprimary
H04LTransmission of digital information, e.g. telegraphic communication25%
G06FElectric digital data processing16%
G01RMeasuring electric variables13%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices10%
H03MCoding6%
H04WWireless communication networks5%
G06VImage or video recognition or understanding2%
H03KPulse technique2%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
Y02PClimate change mitigation technologies in the production or processing of goods2%
PatentTitleYear
11,099,1363D graphene optical sensors and methods of manufacture202110,833,996Identifying a local congestion control algorithm of a virtual machine202010,796,408Variable resolution rendering of objects based on user familiarity202010,768,997Tail latency-based job offloading in load-balanced groups202010,749,993Path selection using TCP handshake in a multipath environment202010,700,978Offloading at a virtual switch in a load-balanced group202010,609,155Scalable self-healing architecture for client-server operations in transient connectivity conditions202010,585,525Adaptive notification modifications for touchscreen interfaces202010,574,569Middlebox tracing in software defined networks202010,572,007Preventing unintended input202010,571,983Continuously available power control system202010,531,332Virtual switch-based congestion control for multiple TCP flows202010,491,698Dynamic distribution of persistent data201910,439,916Client-side fault tolerance in a publish-subscribe system201910,425,338Virtual switch-based congestion control for datacenter networks201910,362,148Path selection using TCP handshake in a multipath environment201910,243,845Middlebox tracing in software defined networks201910,237,186Enforcing datacenter-level congestion control201910,230,640Normalized flow value-based congestion control201910,225,192Identifying a local congestion control algorithm of a virtual machine201910,178,143Selecting bitrate to stream encoded media based on tagging of important media segments201910,158,697Channel ownership in a publish-subscribe system201810,129,366Callee condition based communication with mobile devices201810,063,623Channel ownership in a publish-subscribe system201810,045,252Virtual switch-based congestion control for multiple TCP flows201810,009,236Determining sampling rate from randomly sampled events20189,998,513Selecting bitrate to stream encoded media based on tagging of important media segments20189,985,889Normalized flow value-based congestion control20189,985,890Identifying a local congestion control algorithm of a virtual machine20189,948,547Route tracing in software defined networks20189,942,151Enforcing datacenter-level congestion control20189,893,962'Port mirroring for sampling measurement of network flows'20189,800,640'Differential encoder with look-ahead synchronization'20179,800,648'Channel ownership in a publish-subscribe system'20179,755,969'Route tracing in software defined networks'20179,742,651'Client-side fault tolerance in a publish-subscribe system'20179,729,448'Congestion detection using a differentiated packet pair'20179,715,539'Efficient context save/restore during hardware decompression of DEFLATE encoded data'20179,674,297'Handling packet reordering at a network adapter'20179,634,938'Adaptive scheduling of data flows in data center networks for efficient resource utilization'20179,626,459'Detecting hotspots using machine learning on diffraction patterns'20179,619,391'In-memory caching with on-demand migration'20179,622,043'Past location-based communication with mobile devices'20179,615,216'Future location-based communication with mobile devices'20179,602,964'Current location-based communication with mobile devices'20179,507,250'Optical proximity correction for improved electrical characteristics'20169,473,888'Location-based communication with mobile devices'20169,420,417'Facilitating location-based communication with mobile devices'20169,401,853'Determining sampling rate from randomly sampled events'20169,374,106'Efficient context save/restore during hardware decompression of DEFLATE encoded data'20169,350,607'Scalable network configuration with consistent updates in software defined networks'20169,203,711'Port mirroring for sampling measurement of network flows'20159,112,794'Dynamic multipath forwarding in software defined data center networks'20159,106,252'Selective recompression of a string compressed by a plurality of diverse lossless compression techniques'20159,106,251'Data compression utilizing longest common subsequence template'20158,933,824'Hardware decompression of deflate encoded data with multiple blocks'20158,903,715'High bandwidth parsing of data encoding languages'20148,862,426'Method and test system for fast determination of parameter variation statistics'20148,830,714'High speed large scale dictionary matching'20148,824,569'High bandwidth decompression of variable length encoded data streams'20148,804,852'High bandwidth decompression of variable length encoded data streams'20148,782,573'Solutions for retargeting integrated circuit layouts based on diffraction pattern analysis'20148,704,686'High bandwidth compression to encoded data streams'20148,689,151'Pitch-aware multi-patterning lithography'20148,674,856'Data compression utilizing longest common subsequence template'20148,647,893'Method for post decomposition density balancing in integrated circuit layouts, related system and program product'20148,640,062'Rapid estimation of temperature rise in wires due to Joule heating'20148,627,244'Frequency domain layout decomposition in double patterning lithography'20148,618,960'Selective recompression of a string compressed by a plurality of diverse lossless compression techniques'20138,612,902'Retargeting multiple patterned integrated circuit device designs'20138,594,989'Compensating for variations in device characteristics in integrated circuit simulation'20138,539,421'Layout-specific classification and prioritization of recommended rules violations'20138,516,403'Multiple patterning layout decomposition for ease of conflict removal'20138,495,548'Multi-patterning lithography aware cell placement in integrated circuit design'20138,495,530'Retargeting for electrical yield enhancement'20138,464,194'Machine learning approach to correct lithographic hot-spots'20138,434,033'Mask assignment for multiple patterning lithography'20138,415,077'Simultaneous optical proximity correction and decomposition for double exposure lithography'20138,402,398'Reducing through process delay variation in metal wires'20138,359,556'Resolving double patterning conflicts'20138,347,240'Split-layer design for double patterning lithography'20138,347,255'Equation based retargeting of design layouts'20138,331,646'Optical proximity correction for transistors using harmonic mean of gate length'20128,321,818'Model-based retargeting of layout patterns for sub-wavelength photolithography'20128,281,263'Propagating design tolerances to shape tolerances for lithography'20128,230,372'Retargeting for electrical yield enhancement'20128,217,671'Parallel array architecture for constant current electro-migration stress testing'20128,154,309'Configurable PSRO structure for measuring frequency dependent capacitive loads'20128,151,240'Effective gate length circuit modeling based on concurrent length and mobility analysis'20128,146,026'Simultaneous photolithographic mask and target optimization'20128,136,079'Effective gate length circuit modeling based on concurrent length and mobility analysis'20128,121,822'Integrated circuit modeling based on empirical test data'20128,120,356'Measurement methodology and array structure for statistical stress and test of reliabilty structures'20128,103,983'Electrically-driven optical proximity correction to compensate for non-optical effects'20128,089,296'On-chip measurement of signals'20127,966,535'Secure scan design'20117,917,316'Test system and computer program for determining threshold voltage variation using a device array'20117,868,640'Array-based early threshold voltage recovery characterization measurement'20117,834,649'Method and apparatus for statistical CMOS device characterization'20107,818,137'Characterization circuit for fast determination of device capacitance variation'20107,782,076'Method and apparatus for statistical CMOS device characterization'20107,759,991'Scannable virtual rail ring oscillator circuit and system for measuring variations in device characteristics'20107,759,963'Method for determining threshold voltage variation using a device array'20107,716,620'Moment-based method and system for evaluation of metal layer transient currents in an integrated circuit'20107,698,079'Characterizing across-die process variation'20107,659,749'Pulsed dynamic logic environment metric measurement circuit'20107,622,942'Method and apparatus for measuring device mismatches'20097,564,259'Digital circuit with dynamic power and performance control via per-block selectable operating voltage'20097,560,951'Characterization array circuit'20097,546,519'Method and apparatus for detecting and correcting soft-error upsets in latches'20097,532,078'Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics'20097,447,606'Method of separating the process variation in threshold voltage and effective channel length by electrical measurements'20087,423,446'Characterization array and method for determining threshold voltage variation'20087,408,372'Method and apparatus for measuring device mismatches'20087,397,259'Method and apparatus for statistical CMOS device characterization'20087,298,193'Methods and arrangements to adjust a duty cycle'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2020Patents assigned to IBM (115)· patent assignee history
2007–2020Based in Austin, TX, US· patent location history
2012–2016Patents assigned to AGARWAL KANAK B (31)· patent assignee history
2012–2014Patents assigned to BANERJEE SHAYAK (12)· patent assignee history
2012–2016Patents assigned to NASSIF SANI R (10)· patent assignee history
2012–2014Patents assigned to AGARWAL KANAK BEHARI (6)· patent assignee history
2021Based in Uttar Pradesh, IN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 115 | 2007–2020 |
| AGARWAL KANAK Bself | 31 | 2012–2016 |
| BANERJEE SHAYAK | 12 | 2012–2014 |
| NASSIF SANI R | 10 | 2012–2016 |
| AGARWAL KANAK BEHARIself | 6 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Austin, Texas, US | 115 | 2007–2020 |
| Uttar Pradesh, IN | 1 | 2021 |