Inventor
Robert William Tait
Inventor
Niskayuna, NY, US
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions20%
G01NInvestigating or analysing materials by determining their chemical or physical properties15%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form7%
G06TImage data processing or generation, in general7%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
B29CShaping or joining of plastics4%
B61KAuxiliary equipment specially adapted for railways, not otherwise provided for4%
B61LGuiding railway traffic4%
F28FDetails of heat-exchange and heat-transfer apparatus, of general application4%
G01KMeasuring temperature4%
PatentTitleYear
10,842,046Densified foam for thermal insulation in electronic devices202010,448,541Densified foam for thermal insulation in electronic devices201910,192,298System and method for monitoring tape ends of a composite layup machine20199,724,876'Operational performance assessment of additive manufacturing'20179,719,766'Method and system for measurement using a telescopic gauge'20179,441,937'Method and apparatus for measuring thickness of an object'20169,255,779'Wireless taper gauge and method of using same'20169,007,689'Method and apparatus for forming multiple images'20158,919,004'Digital feeler gauge and method of using same'20148,244,488'Thermal inspection systems'20128,160,832'Apparatus and method for identifying a defect and/or operating characteristic of a system'20128,063,385'Method and apparatus for ultraviolet scan planning'20117,693,673'Apparatus and method for identifying a defect and/or operating characteristic of a system'20107,492,450'Methods and apparatus for inspecting an object'20097,466,426'Phase shifting imaging module and method of imaging'20087,435,986'System and method for detecting repeating defects in a light-management film'20087,199,386'System and method for detecting defects in a light-management film'20076,598,994'Multi-angle inspection of manufactured products'20036,286,978'Light array system and method for illumination of objects imaged by imaging systems'20016,161,941'Light array system and method for illumination of objects imaged by imaging systems'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2003Patents assigned to INTELLIGENT REASONING SYSTEMS (3)· patent assignee history
2000–2012Based in Brighton, MI, US· patent location history
2007–2019Patents assigned to GEN ELECTRIC (13)· patent assignee history
2011–2015Patents assigned to TAIT ROBERT WILLIAM (4)· patent assignee history
2011–2019Based in Niskayuna, NY, US· patent location history
2015Patents assigned to ABRAMOVICH GIL (1)· patent assignee history
2019–2020Patents assigned to BOYD CORP (2)· patent assignee history
2019–2020Based in Plano, TX, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 13 | 2007–2019 |
| TAIT ROBERT WILLIAMself | 4 | 2011–2015 |
| INTELLIGENT REASONING SYSTEMS | 3 | 2000–2003 |
| BOYD CORP | 2 | 2019–2020 |
| ABRAMOVICH GIL | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 9 | 2011–2019 |
| Brighton, MI, US | 9 | 2000–2012 |
| Plano, Texas, US | 2 | 2019–2020 |