Inventor

Kunio Matsumoto

Inventor

Yokohama, JP

Overview

41→

Patents

1976–2021

Patent span

Physics

Primary field (CPC G)

Patents· 41 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Wprimary

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1014%

G11BInformation storage based on relative movement between record carrier and transducer12%

G03BApparatus or arrangements for taking photographs or for projecting or viewing them11%

H05KPrinted circuits8%

G01RMeasuring electric variables6%

Y02PClimate change mitigation technologies in the production or processing of goods5%

F02BInternal-combustion piston engines3%

G02BOptical elements, systems or apparatus3%

H03HImpedance networks, e.g. resonant circuits3%

H04NPictorial communication, e.g. television3%

PatentTitleYear

11,041,457Combustion chamber structure for engines2021 11,015,515Combustion chamber structure for engine2021 9,778,812'Screen transition diagram creator'2017 9,740,186'Monitoring control system and control device'2017 7,675,387'Surface acoustic wave device and communication terminal using the same'2010 7,548,503'Recording medium, information recording apparatus, information recording method, information recording medium, and recording program'2009 7,385,892'Recording medium, information recording apparatus, information recording method, information recording medium, and recording program'2008 7,211,934'Electronic device and method of manufacturing the same'2007 7,198,962'Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step'2007 6,635,971'Electronic device and optical transmission module'2003 6,566,150'Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step'2003 6,554,194'IC card and its manufacturing method'2003 6,455,335'Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step'2002 6,197,603'Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step'2001 6,153,938'Flip-chip connecting method, flip-chip connected structure and electronic device using the same'2000 6,144,339'Array antenna'2000 5,811,877'Semiconductor device structure'1998 5,745,446'Multi-disc storage player for performing continuous playing of a plurality of discs without occurrence of a disc-search-disabled state caused by imperfect storage of discs'1998 5,491,301'Shielding method and circuit board employing the same'1996 5,406,027'Mounting structure and electronic device employing the same'1995 5,373,112'Multilayered wiring board having printed inductor'1994 5,263,010'Information reproducing system identifying previously stored playback information'1993 5,219,765'Method for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of the inspection to the device fabrication process'1993 5,195,066'Information reproducing system for reproducing a group of recording mediums in accordance with stored program information'1993 5,157,646'Information reproducing system for playing back recording mediums according to previously stored information'1992 5,113,383'Information reproducing system and method'1992 5,089,104'Method and apparatus for forming a multiple-element thin film based on ion beam sputtering'1992 5,086,337'Connecting structure of electronic part and electronic device using the structure'1992 5,051,973'Method for playing back music pieces recorded on recording media'1991 4,922,377'Module and a substrate for the module'1990 4,893,172'Connecting structure for electronic part and method of manufacturing the same'1990 4,779,131'Apparatus for detecting television image movement'1988 4,731,651'Apparatus for compensating a movement of a picture of television signal'1988 4,717,929'Camera auto sensing system for ISO speed'1988 4,564,261'Bundle of optical fibers'1986 4,174,897'X-Class synchronization contact means for electric shutters'1979 4,143,955'Flash synchronization controlling means for program type electric shutters'1979 4,127,326'Electric shutter'1978 4,024,549'Auto-strobe means for cameras'1977 3,978,496'Automatic flash-photographing arrangement'1976 3,953,865'Electric shutter'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1976–1988Patents assigned to COPAL CO LTD (7)· patent assignee history

1976–1979Based in Ageo, JP· patent location history

1986–2007Patents assigned to HITACHI LTD (17)· patent assignee history

1986–2007Based in Yokohama, JP· patent location history

1988–2017Based in Tokyo, JP· patent location history

1991–1998Patents assigned to PIONEER ELECTRONIC CORP (6)· patent assignee history

1991–2009Based in Tokorozawa, JP· patent location history

2003–2010Based in Koshigaya, JP· patent location history

2007–2010Patents assigned to HITACHI MEDIA ELECTRON KK (2)· patent assignee history

2021Patents assigned to MAZDA MOTOR (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
HITACHI LTD	17	1986–2007
COPAL CO LTD	7	1976–1988
PIONEER ELECTRONIC CORP	6	1991–1998
HITACHI MEDIA ELECTRON KK	2	2007–2010
MAZDA MOTOR	2	2021

Locations

Location	Patents	Span
Yokohama, JP	15	1986–2007
Tokorozawa, JP	7	1991–2009
Ageo, JP	6	1976–1979
Tokyo, JP	4	1988–2017
Koshigaya, JP	3	2003–2010