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Inventor

Hajime Kawano

Inventor
Tokyo, JP

Overview

72→
Patents
1992–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 72 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps49%
G01RMeasuring electric variables9%
G01BMeasuring length, thickness or similar linear dimensions5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
H01TSpark gaps4%
LOC154%
G01TMeasurement of nuclear or x-radiation3%
H01FMagnets3%
H01LSemiconductor devices3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
11,133,147Charged particle ray device and cross-sectional shape estimation program202111,101,100Charged particle ray device and cross-sectional shape estimation program202111,062,892Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer202110,923,368Substrate processing apparatus, substrate processing method, and storage medium202110,818,470Charged particle beam device202010,796,880Charged particle beam device and charged particle beam device noise source determination method202010,720,306Charged particle beam device202010,707,047Measuring device and measuring method202010,692,687Measurement and inspection device202010,679,821Light guide, detector having light guide, and charged particle beam device202010,593,512Light guide, detector having light guide, and charged particle beam device202010,559,447Charged particle beam device with transient signal correction during beam blanking202010,546,718High voltage power supply device and charged particle beam device202010,546,715Charged particle beam device202010,446,359Charged particle beam device201910,424,459Charged particle beam device201910,373,797Charged particle beam device and image forming method using same201910,297,419Scanning electron microscope with charge density control201910,249,474Charged particle beam device201910,217,604Charged particle beam apparatus201910,148,070Machining apparatus, component producing method, and spark plug producing method201810,134,558Scanning electron microscope201810,121,634Charged particle beam device and charged particle beam measurement method201810,116,123Inspection method and apparatus of spark plug insulator201810,020,160Charged particle beam device201810,014,160Scanning electron microscope and method for controlling same20189,978,558Scanning-electron-microscope image processing device and scanning method20189,960,006Charged-particle-beam device20189,859,094'Charged particle beam apparatus and image forming method of charged particle beam apparatus'20189,799,483'Charged particle beam device and detection method using said device'20179,748,742'Apparatus and method for manufacturing spark plug'20179,697,987'Charged particle beam device'20179,679,740'Charged particle beam device'20179,644,955'Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using same'20179,633,818'Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatus'20179,543,053'Electron beam equipment'20179,520,266'Pattern critical dimension measurement equipment and method for measuring pattern critical dimension'20169,478,392'Charged particle beam apparatus and image generation method'20169,443,695'Charged-particle beam device'20169,368,324'Measurement and inspection device'20169,368,319'Method for removing foreign substances in charged particle beam device, and charged particle beam device'20169,343,878'Manufacturing method of main metal fitting for spark plug and manufacturing method of spark plug'20169,336,984'Charged particle beam device and measuring method using the same'20169,312,091'Charged particle beam apparatus'20169,236,220'Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope'20169,177,759'Processing apparatus and method using a scanning electron microscope'20159,053,905'Electron beam irradiation apparatus'20159,006,654'Charged particle beam apparatus'20158,890,096'Measuring/inspecting apparatus and measuring/inspecting method enabling blanking control of electron beam'20148,618,499'Electron beam irradiation apparatus'20138,577,498'Automatic transfer method, transfer robot, and automatic transfer system'20138,334,520'Charged particle beam apparatus'2012D0663333'Autonomous mobile robot'2012D0663334'Autonomous mobile robot'2012D0644256'Autonomous mobile robot'2011D0644257'Autonomous mobile robot'20117,778,776'Obstacle avoidance method and obstacle-avoidable mobile apparatus'20106,909,798'Method of erasing repeated patterns and pattern defect inspection device'20056,853,281'Magnet apparatus and mri apparatus'20056,831,283'Charged particle beam drawing apparatus and pattern forming method'20046,828,573'Electron beam lithography system'20046,816,047'Magnetic resonance imaging apparatus'20046,781,492'Superconducting magnetic apparatus'20046,674,086'Electron beam lithography system, electron beam lithography apparatus, and method of lithography'20046,600,318'Open MRI system with a vertical static field and an imaging volume closer to the lower than to the upper magnet assembly'20036,580,346'Magnetic resonance imaging apparatus'20036,541,784'Electron beam exposure system and exposing method using an electron beam'20036,437,672'Superconducting magnetic device'20026,037,850'Superconducting magnet apparatus and method of regulating magnetization thereof'20005,936,498'Superconducting magnet apparatus and magnetic resonance imaging system using the same'19995,633,588'Superconducting magnet apparatus using superconducting multilayer composite member, method of magnetizing the same and magnetic resonance imaging system employing the same'19975,113,161'Case for housing integrated microwave circuits'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997–2005Patents assigned to HITACHI MEDICAL CORP (9)· patent assignee history
1999–2021Based in Tokyo, JP· patent location history
2002–2019Based in Hitachinaka, JP· patent location history
2003–2005Patents assigned to HITACHI LTD (5)· patent assignee history
2005–2013Based in Osaka, JP· patent location history
2010–2013Patents assigned to PANASONIC CORP (6)· patent assignee history
2012–2021Patents assigned to HITACHI HIGH TECH CORP (45)· patent assignee history
2012–2019Patents assigned to KAWANO HAJIME (5)· patent assignee history
2017–2018Based in Konan, JP· patent location history
2021Based in Kumamoto, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP452012–2021
HITACHI MEDICAL CORP91997–2005
PANASONIC CORP62010–2013
HITACHI LTD52003–2005
KAWANO HAJIMEself52012–2019
Locations
LocationPatentsSpan
Tokyo, JP451999–2021
Hitachinaka, JP132002–2019
Osaka, JP72005–2013
Konan, JP32017–2018
Kumamoto, JP12021