Inventor
Wenbing Yun
Inventor
Walnut Creek, CA, US
Overview
Patents· 68 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G21Kprimary
G21KHandling of particles or ionising radiation not otherwise provided for26%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
H01JElectric discharge tubes or discharge lamps18%
A61BDiagnosis11%
G01TMeasurement of nuclear or x-radiation4%
G02BOptical elements, systems or apparatus4%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
B82YSpecific uses or applications of nanostructures2%
H05GX-ray technique2%
PatentTitleYear
RE048612X-ray interferometric imaging system202110,845,491Energy-resolving x-ray detection system202010,653,376X-ray imaging system202010,656,105Talbot-lau x-ray source and interferometric system202010,658,145High brightness x-ray reflection source202010,578,566X-ray emission spectrometer system202010,466,185X-ray interrogation system using multiple x-ray beams201910,416,099Method of performing X-ray spectroscopy and X-ray absorption spectrometer system201910,401,309X-ray techniques using structured illumination201910,352,880Method and apparatus for x-ray microscopy201910,349,908X-ray interferometric imaging system201910,304,580Talbot X-ray microscope201910,295,485X-ray transmission spectrometer system201910,295,486Detector for X-rays with high spatial and high spectral resolution201910,297,359X-ray illumination system with multiple target microstructures201910,269,528Diverging X-ray sources using linear accumulation201910,247,683Material measurement techniques using multiple X-ray micro-beams20199,874,531X-ray method for the measurement, characterization, and analysis of periodic structures20189,823,203'X-ray surface analysis and measurement apparatus'20179,719,947'X-ray interferometric imaging system'20179,594,036'X-ray surface analysis and measurement apparatus'20179,570,265'X-ray fluorescence system with high flux and high flux density'20179,543,109'X-ray sources using linear accumulation'20179,448,190'High brightness X-ray absorption spectroscopy system'20169,449,781'X-ray illuminators with high flux and high flux density'20169,390,881'X-ray sources using linear accumulation'20169,142,382'X-ray source with an immersion lens'20159,016,943'X-ray microscope system with cryogenic handling system and method'20158,995,622'X-ray source with increased operating life'20158,831,179'X-ray source with selective beam repositioning'20148,737,565'Compound x-ray lens having multiple aligned zone plates'20148,602,648'X-ray microscope system with cryogenic handling system and method'20138,526,575'Compound X-ray lens having multiple aligned zone plates'20138,353,628'Method and system for tomographic projection correction'20138,068,579'Process for examining mineral samples with X-ray microscope and projection systems'20117,974,379'Metrology and registration system and method for laminography and tomography'20117,920,676'CD-GISAXS system and method'20117,864,426'High aspect-ratio X-ray diffractive structure stabilization methods and systems'20117,813,475'X-ray microscope with switchable x-ray source'20107,800,072'Low pass X-ray scintillator system'20107,796,725'Mechanism for switching sources in x-ray microscope'20107,787,588'System and method for quantitative reconstruction of Zernike phase-contrast images'20107,561,662'X-ray micro-tomography system optimized for high resolution, throughput, image quality'20097,499,521'System and method for fuel cell material x-ray analysis'20097,443,953'Structured anode X-ray source for X-ray microscopy'20087,414,787'Phase contrast microscope for short wavelength radiation and imaging method'20087,412,024'X-ray mammography'20087,406,151'X-ray microscope with microfocus source and Wolter condenser'20087,400,704'High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source'20087,394,890'Optimized x-ray energy for high resolution imaging of integrated circuits structures'20087,388,942'X-ray micro-tomography system optimized for high resolution, throughput, image quality'20087,365,918'Fast x-ray lenses and fabrication method therefor'20087,365,909'Fabrication methods for micro compounds optics'20087,297,959'Lens bonded X-ray scintillator system and manufacturing method therefor'20077,286,640'Dual-band detector system for x-ray imaging of biological samples'20077,268,945'Short wavelength metrology imaging system'20077,245,696'Element-specific X-ray fluorescence microscope and method of operation'20077,215,736'X-ray micro-tomography system optimized for high resolution, throughput, image quality'20077,183,547'Element-specific X-ray fluorescence microscope and method of operation'20077,170,969'X-ray microscope capillary condenser system'20077,130,375'High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source'20067,119,953'Phase contrast microscope for short wavelength radiation and imaging method'20067,095,822'Near-field X-ray fluorescence microprobe'20067,057,187'Scintillator optical system and method of manufacture'20066,917,472'Achromatic fresnel optics for ultraviolet and x-ray radiation'20056,914,723'Reflective lithography mask inspection tool based on achromatic Fresnel optics'20056,885,503'Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations'20056,815,363'Method for nanomachining high aspect ratio structures'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2021Based in Walnut Creek, CA, US· patent location history
2005–2014Patents assigned to XRADIA INC (36)· patent assignee history
2011–2017Patents assigned to YUN WENBING (8)· patent assignee history
2013–2015Patents assigned to CARL ZEISS X RAY MICROSCOPY INC (6)· patent assignee history
2014–2015Patents assigned to ADLER DAVID L (3)· patent assignee history
2016–2021Patents assigned to SIGRAY INC (26)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| XRADIA INC | 36 | 2005–2014 |
| SIGRAY INC | 26 | 2016–2021 |
| YUN WENBINGself | 8 | 2011–2017 |
| CARL ZEISS X RAY MICROSCOPY INC | 6 | 2013–2015 |
| ADLER DAVID L | 3 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Walnut Creek, California, US | 68 | 2004–2021 |