Inventor
Benjamin John Cook
Inventor
Munich, DE
Overview
Patents· 12 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps86%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices7%
PatentTitleYear
10,784,070Charged particle beam device, field curvature corrector, and methods of operating a charged particle beam device202010,748,743Device and method for operating a charged particle device with multiple beamlets202010,593,509Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device202010,483,080Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device20199,754,759'Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole device'20179,666,405'System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam device'20179,666,406'Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device'20179,620,328'Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of operating an electrostatic multipole device'20179,620,329'Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole device'20179,305,740'Charged particle beam system and method of operating thereof'20169,035,249'Multi-beam system for high throughput EBI'20158,569,712'Beam blanker for interrupting a beam of charged particles'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2016Patents assigned to COOK BENJAMIN JOHN (2)· patent assignee history
2013Patents assigned to FEI CO (1)· patent assignee history
2013Based in The Hague, NL· patent location history
2015–2016Patents assigned to INTEGRATED CIRCUIT TESTING (2)· patent assignee history
2015–2020Based in Munich, DE· patent location history
2017–2020Patents assigned to ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH (6)· patent assignee history
2017Based in München, DE· patent location history
2019–2020Patents assigned to ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH | 6 | 2017–2020 |
| ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH | 3 | 2019–2020 |
| COOK BENJAMIN JOHNself | 2 | 2013–2016 |
| INTEGRATED CIRCUIT TESTING | 2 | 2015–2016 |
| FEI CO | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Munich, DE | 6 | 2015–2020 |
| München, DE | 5 | 2017 |
| The Hague, NL | 1 | 2013 |