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Inventor

Takahiro Yamakura

Inventor
Tokyo, JP

Overview

1→
Patents
2012
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
PatentTitleYear
8,339,617'Film thickness measuring device and film thickness measuring method'2012

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2012Patents assigned to HAYASHI SHINJI (1)· patent assignee history
2012Patents assigned to KAWAI SHINGO (1)· patent assignee history
2012Patents assigned to NIRECO CORP (1)· patent assignee history
2012Patents assigned to YAMADA TAKEO (1)· patent assignee history
2012Patents assigned to YAMAKURA TAKAHIRO (1)· patent assignee history
2012Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HAYASHI SHINJI12012
KAWAI SHINGO12012
NIRECO CORP12012
YAMADA TAKEO12012
YAMAKURA TAKAHIROself12012
Locations
LocationPatentsSpan
Tokyo, JP12012