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Inventor

Gayoung Son

Inventor
Seoul, KR

Overview

2→
Patents
2006–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1050%
LOC2150%
PatentTitleYear
D0910783Character figure20216,985,830'Method of measuring the probability of failure caused only by defects, method of measuring defect limited yield, and system using the same'2006

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2006Patents assigned to SAMSUNG ELECTRONICS CO LTD (1)· patent assignee history
2006Based in Yongin, KR· patent location history
2021Patents assigned to CHA YESEUL (1)· patent assignee history
2021Patents assigned to SHINE SUN MI (1)· patent assignee history
2021Patents assigned to SON GAYOUNG (1)· patent assignee history
2021Based in Seoul, KR· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CHA YESEUL12021
SAMSUNG ELECTRONICS CO LTD12006
SHINE SUN MI12021
SON GAYOUNGself12021
Locations
LocationPatentsSpan
Seoul, KR12021
Yongin, KR12006