Inventor
Balamurugan Sankaranarayanan
Inventor
Kent, WA, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
G01VGeophysics20%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes20%
G06TImage data processing or generation, in general20%
G08BSignalling systems, e.g. personal calling systems20%
PatentTitleYear
11,099,294Distributed analysis x-ray inspection methods and systems202110,830,920Distributed analysis X-ray inspection methods and systems202010,509,142Distributed analysis x-ray inspection methods and systems201910,422,919X-ray inspection system that integrates manifest data with imaging/detection processing20199,111,331'X-ray inspection system that integrates manifest data with imaging/detection processing'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2021Patents assigned to RAPISCAN SYSTEMS INC (5)· patent assignee history
2015Patents assigned to ABEL JEFFERY BRYAN (1)· patent assignee history
2015Patents assigned to KUMAR SIVA (1)· patent assignee history
2015Patents assigned to PARIKH SHEHUL SAILESH (1)· patent assignee history
2015Patents assigned to SANKARANARAYANAN BALAMURUGAN (1)· patent assignee history
2015–2021Based in Kent, WA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RAPISCAN SYSTEMS INC | 5 | 2015–2021 |
| ABEL JEFFERY BRYAN | 1 | 2015 |
| KUMAR SIVA | 1 | 2015 |
| PARIKH SHEHUL SAILESH | 1 | 2015 |
| SANKARANARAYANAN BALAMURUGANself | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kent, Washington, US | 5 | 2015–2021 |