Inventor
Avi Abramov
Inventor
Haifa, IL
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
F21Vprimary
F21VFunctional features or details of lighting devices or systems thereof17%
G02BOptical elements, systems or apparatus17%
G01BMeasuring length, thickness or similar linear dimensions13%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light13%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices9%
H01JElectric discharge tubes or discharge lamps9%
G06TImage data processing or generation, in general4%
H04NPictorial communication, e.g. television4%
PatentTitleYear
10,677,588Localized telecentricity and focus optimization for overlay metrology202010,203,247Systems for providing illumination in optical metrology20199,921,050'Spectral control system'20189,719,940'Compressive sensing with illumination patterning'20179,512,985'Systems for providing illumination in optical metrology'20169,341,769'Spectral control system'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016–2020Patents assigned to KLA TENCOR CORP (6)· patent assignee history
2016–2020Based in Haifa, IL· patent location history
2017–2018Patents assigned to KLA—TENCOR CORP (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 6 | 2016–2020 |
| KLA—TENCOR CORP | 2 | 2017–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Haifa, IL | 6 | 2016–2020 |