Inventor

Akihiko Sekine

Inventor

Tokyo, JP

Overview

25→

Patents

1989–2016

Patent span

Physics

Primary field (CPC G)

Patents· 25 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties35%

A61BDiagnosis28%

G01BMeasuring length, thickness or similar linear dimensions13%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices10%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%

A61FFilters implantable into blood vessels3%

G02BOptical elements, systems or apparatus3%

G06TImage data processing or generation, in general3%

PatentTitleYear

9,476,693'Optical property measurement apparatus and optical property measurement method'2016 9,456,745'Fundus observation apparatus and fundus image analyzing apparatus'2016 8,724,870'Ophthalmic observation apparatus'2014 7,760,349'Mask-defect inspecting apparatus with movable focusing lens'2010 7,551,273'Mask defect inspection apparatus'2009 7,522,276'Pattern inspection method'2009 7,379,176'Mask defect inspection apparatus'2008 7,372,560'Pattern inspection apparatus'2008 7,348,585'Surface inspection apparatus'2008 7,245,366'Surface inspection method and surface inspection apparatus'2007 7,154,597'Method for inspecting surface and apparatus for inspecting it'2006 6,104,481'Surface inspection apparatus'2000 6,100,970'Apparatus for inspecting slight defects on a photomask pattern'2000 5,912,732'Surface detecting apparatus'1999 5,812,259'Method and apparatus for inspecting slight defects in a photomask pattern'1998 5,349,399'Intraocular length measuring instrument having phase compensating means'1994 5,347,328'Apparatus for measuring an intraocular length between anterior and posterior portions of an eye'1994 5,347,327'Process and apparatus for measuring axial eye length'1994 5,141,302'Intraocular length measuring instrument'1992 5,107,106'Scanning and detecting optical device'1992 5,088,811'Laser beam scanning type eye fundus observing device'1992 5,066,116'Optical system in a laser scanning eye fundus camera'1991 4,968,130'Laser beam scanning type ophthalmological instrument'1990 4,933,756'Eye fundus camera'1990 4,854,691'Laser beam scanning type eye fundus camera'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–2014Based in Tokyo, JP· patent location history

1990–2014Patents assigned to TOPCON CORP (22)· patent assignee history

1998–2009Patents assigned to TOSHIBA KK (4)· patent assignee history

2009Based in Itabashi-ku, JP· patent location history

2014Patents assigned to OBATA NOBUSUKE (1)· patent assignee history

2014Patents assigned to SEKINE AKIHIKO (1)· patent assignee history

2016Patents assigned to KK TOPCON (2)· patent assignee history

2016Based in Inagi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
TOPCON CORP	22	1990–2014
TOSHIBA KK	4	1998–2009
KK TOPCON	2	2016
OBATA NOBUSUKE	1	2014
SEKINE AKIHIKOself	1	2014

Locations

Location	Patents	Span
Tokyo, JP	22	1989–2014
Inagi, JP	2	2016
Itabashi-ku, JP	1	2009