Inventor
Jun Nakazato
Inventor
Kashiwa, JP
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Gprimary
G03GElectrography34%
G01NInvestigating or analysing materials by determining their chemical or physical properties24%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1024%
G01RMeasuring electric variables5%
H04NPictorial communication, e.g. television5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
G06FElectric digital data processing2%
PatentTitleYear
10,935,915Image forming apparatus having test patterns for image density adjustment202110,372,066Image forming apparatus201910,353,332Image forming apparatus including sensor having substrate on which light-emitting element and light-receiving element are provided20198,867,961'Image forming apparatus capable of preventing belt from meandering'20148,565,634'Image forming apparatus'20138,538,284'Image forming apparatus controlling belt position in a perpendicular direction to a belt conveying direction'20138,326,194'Belt driving apparatus having belt with detection marks'20128,244,157'Image-forming apparatus'20128,175,505'Image forming apparatus with emitted light control based on reflected light amounts'20128,095,044'Rotary member driving apparatus'20127,991,336'Image forming apparatus with irradiated light control based on reflected light amounts'20117,590,364'Image forming apparatus with irradiated light control based on reflected light amounts'20097,433,620'Image forming apparatus with controlled electric power supply to heating member'20087,292,795'Image forming apparatus with carbon based fixing material'20076,757,621'Process management system'20046,628,817'Inspection data analyzing system'20036,542,830'Process control system'20036,529,619'Inspection data analyzing system'20036,404,911'Semiconductor failure analysis system'20026,339,653'Inspection data analyzing system'20026,330,352'Inspection data analyzing system'20016,185,324'Semiconductor failure analysis system'20016,185,322'Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device'20015,841,893'Inspection data analyzing system'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2004Patents assigned to HITACHI LTD (10)· patent assignee history
1998–2003Based in Tokyo, JP· patent location history
2003–2004Based in Shinagawa-ku, JP· patent location history
2007–2021Patents assigned to CANON KK (14)· patent assignee history
2007–2008Based in Toride, JP· patent location history
2009–2014Based in Kashiwa, JP· patent location history
2012–2014Patents assigned to NAKAZATO JUN (7)· patent assignee history
2012Patents assigned to ATARASHI SATOSHI (3)· patent assignee history
2012Patents assigned to FUJIWARA YUKIHIRO (3)· patent assignee history
2019–2021Based in Noda, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CANON KK | 14 | 2007–2021 |
| HITACHI LTD | 10 | 1998–2004 |
| NAKAZATO JUNself | 7 | 2012–2014 |
| ATARASHI SATOSHI | 3 | 2012 |
| FUJIWARA YUKIHIRO | 3 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kashiwa, JP | 9 | 2009–2014 |
| Tokyo, JP | 8 | 1998–2003 |
| Noda, JP | 3 | 2019–2021 |
| Toride, JP | 2 | 2007–2008 |
| Shinagawa-ku, JP | 2 | 2003–2004 |