Inventor
Shridhar Champaknath Nath
Inventor
Niskayuna, NY, US
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties44%
G01BMeasuring length, thickness or similar linear dimensions9%
B29CShaping or joining of plastics6%
B29LIndexing scheme associated with subclass b29c, relating to particular articles6%
F03DWind motors6%
F05BIndexing scheme relating to wind, spring, weight, inertia or like motors, to machines or engines for liquids covered by subclasses f03b, f03d and f03g6%
H01HElectric switches6%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution6%
Y02PClimate change mitigation technologies in the production or processing of goods6%
B29DProducing particular articles from plastics or from substances in a plastic state3%
PatentTitleYear
11,022,094Modular blade structure and method of assembly202110,830,206Methods for manufacturing wind turbine rotor blades and components thereof20208,436,608'Eddy current inspection system and method'20138,240,210'Method and system for multimodal inspection with a coordinate measuring device'20127,402,999'Pulsed eddy current pipeline inspection system and method'20087,015,690'Omnidirectional eddy current probe and inspection system'20066,911,826'Pulsed eddy current sensor probes and inspection methods'20056,888,347'Omnidirectional eddy current probes, array probes, and inspection systems'20056,812,697'Molded eddy current array probe'20046,794,963'Magnetic device for a magnetic trip unit'20046,720,775'Pulsed eddy current two-dimensional sensor array inspection probe and system'20046,707,297'Method for in-situ eddy current inspection of coated components in turbine engines'20046,670,808'Self reference eddy current probe, measurement system, and measurement method'20036,545,469'Embedded eddy current inspection apparatus, system, and method'20036,429,759'Split and angled contacts'20026,414,483'Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component'20025,942,894'Radially focused eddy current sensor for detection of longitudinal flaws in metallic tubes'19995,847,562'Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm'19985,698,977'Eddy current method for fatigue testing'19975,648,721'Rotating flux-focusing eddy current probe for flaw detection'19975,617,024'Flux focusing eddy current probe'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997Patents assigned to US ARMY (3)· patent assignee history
1997–1999Based in Gaithersburg, MD, US· patent location history
1998–1999Patents assigned to NASA (2)· patent assignee history
1998Based in Ames, IA, US· patent location history
2002–2021Patents assigned to GEN ELECTRIC (16)· patent assignee history
2002–2021Based in Niskayuna, NY, US· patent location history
2004Based in Niksayuna, NY, US· patent location history
2012Patents assigned to KRAY NICHOLAS JOSEPH (1)· patent assignee history
2012Patents assigned to NATH SHRIDHAR (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 16 | 2002–2021 |
| US ARMY | 3 | 1997 |
| NASA | 2 | 1998–1999 |
| KRAY NICHOLAS JOSEPH | 1 | 2012 |
| NATH SHRIDHARself | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Niskayuna, New York, US | 15 | 2002–2021 |
| Gaithersburg, Maryland, US | 4 | 1997–1999 |
| Niksayuna, New York, US | 1 | 2004 |
| Ames, IA, US | 1 | 1998 |