Inventor
Wouter Lodewijk Elings
Inventor
Taipei, TW
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions14%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices14%
G05BControl or regulating systems in general14%
H01LSemiconductor devices14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
Y02PClimate change mitigation technologies in the production or processing of goods14%
PatentTitleYear
10,996,176Methods and apparatus for measuring a property of a substrate202110,746,668Methods and apparatus for measuring a property of a substrate202010,317,191Methods and apparatus for measuring a property of a substrate20199,594,029'Methods and apparatus for measuring a property of a substrate'2017Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2017–2021Patents assigned to ASML NETHERLANDS BV (4)· patent assignee history
2017–2021Based in Taipei, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 4 | 2017–2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Taipei, TW | 4 | 2017–2021 |