Inventor
Shuzo Mishima
Inventor
Hachioji, JP
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus32%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests32%
B82YSpecific uses or applications of nanostructures14%
G02BOptical elements, systems or apparatus7%
A61PSpecific therapeutic activity of chemical compounds or medicinal preparations4%
C07DHeterocyclic compounds4%
H02NElectric machines not otherwise provided for4%
H10NElectric solid-state devices not otherwise provided for4%
PatentTitleYear
6,898,004'Microscope system'20056,246,054'Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls'20016,127,681'Scanning tunnel microscope'20005,296,704'Scanning tunneling microscope'19945,260,824'Atomic force microscope'19935,253,515'Atomic probe microscope and cantilever unit for use in the microscope'1993D0335888'Probe for a scanning tunneling microscope'19935,083,022'Scanning tunneling microscope'19925,059,793'Scanning tunneling microscope having proper servo control function'19915,041,783'Probe unit for an atomic probe microscope'19914,877,957'Scanning type tunnel microscope'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2005Patents assigned to OLYMPUS OPTICAL CO (11)· patent assignee history
1989Based in Tokyo, JP· patent location history
1991–2005Based in Hachioji, JP· patent location history
2000Based in Hachiooji, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS OPTICAL CO | 11 | 1989–2005 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hachioji, JP | 9 | 1991–2005 |
| Hachiooji, JP | 1 | 2000 |
| Tokyo, JP | 1 | 1989 |