Inventor
Keiichi Takanashi
Inventor
Tokyo, JP
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
C30Bprimary
C30BSingle-crystal growth35%
Y10TTechnical subjects covered by former us classification30%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
B24BMachines, devices, or processes for grinding or polishing6%
H01LSemiconductor devices6%
G01BMeasuring length, thickness or similar linear dimensions4%
G06TImage data processing or generation, in general4%
G01NInvestigating or analysing materials by determining their chemical or physical properties2%
G01RMeasuring electric variables2%
G05BControl or regulating systems in general2%
PatentTitleYear
10,903,099Semiconductor wafer placement position determination method and semiconductor epitaxial wafer production method202110,472,733Silicon single crystal manufacturing method201910,261,125Semiconductor wafer evaluation standard setting method, semiconductor wafer evaluation method, semiconductor wafer manufacturing process evaluation method, and semiconductor wafer manufacturing method20199,816,199'Method of manufacturing single crystal'20179,708,731'Method of producing silicon single crystal'20179,707,659'Method and apparatus for polishing workpiece'20179,567,692'Silicon single crystal manufacturing apparatus and silicon single crystal manufacturing method'20179,289,876'Method and apparatus for polishing work'20169,284,660'Apparatus of producing silicon single crystal and method of producing silicon single crystal'20168,900,033'Wafer polishing method'20148,871,023'Silicon single crystal pull-up apparatus and method of manufacturing silicon single crystal'20148,801,853'Mechanism for controlling melt level in single crystal pulling apparatus, method for controlling melt level in single crystal pulling apparatus, mechanism for adjusting melt level in single crystal pulling apparatus and method for adjusting melt level while pulling single crystal'20148,673,075'Procedure for in-situ determination of thermal gradients at the crystal growth front'20148,641,822'Method and apparatus for controlling diameter of a silicon crystal ingot in a growth process'20148,545,623'Method and apparatus for controlling the growth process of a monocrystalline silicon ingot'20138,496,765'Method for correcting speed deviations between actual and nominal pull speed during crystal growth'20138,414,701'Method for manufacturing silicon single crystal in which a crystallization temperature gradient is controlled'20138,221,545'Procedure for in-situ determination of thermal gradients at the crystal growth front'20128,187,378'Silicon single crystal pulling method'20128,012,255'Method and apparatus for controlling diameter of a silicon crystal ingot in a growth process'20117,264,674'Method for pulling a single crystal'20077,172,656'Device and method for measuring position of liquid surface or melt in single-crystal-growing apparatus'20076,411,391'Crystal section shape measuring method'20026,187,090'Methods and a device for measuring melt surface temperature within apparatus for pulling a single crystal'20016,111,262'Method for measuring a diameter of a crystal'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2007Based in Nishinomiya, JP· patent location history
2001Based in Hyogo, JP· patent location history
2007–2021Based in Tokyo, JP· patent location history
2011–2021Patents assigned to SUMCO CORP (19)· patent assignee history
2011–2014Patents assigned to SUMCO PHOENIX CORP (6)· patent assignee history
2011–2019Based in Saga, JP· patent location history
2012–2017Patents assigned to TAKANASHI KEIICHI (12)· patent assignee history
2012–2014Patents assigned to ORSCHEL BENNO (5)· patent assignee history
2012–2014Patents assigned to KEARNS JOEL (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SUMCO CORP | 19 | 2011–2021 |
| TAKANASHI KEIICHIself | 12 | 2012–2017 |
| SUMCO PHOENIX CORP | 6 | 2011–2014 |
| ORSCHEL BENNO | 5 | 2012–2014 |
| KEARNS JOEL | 3 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 13 | 2007–2021 |
| Saga, JP | 8 | 2011–2019 |
| Nishinomiya, JP | 3 | 2000–2007 |
| Hyogo, JP | 1 | 2001 |