Inventor
Eric J. Meisenzahl
Inventor
Ontario, NY, US
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television33%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation28%
H01LSemiconductor devices8%
Y10TTechnical subjects covered by former us classification8%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices5%
G06VImage or video recognition or understanding5%
H05KPrinted circuits5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
H10DInorganic electric semiconductor devices3%
PatentTitleYear
10,341,590Methods and apparatus for a CCD image sensor20199,392,736'Methods for producing image sensors having multi-purpose architectures'20168,800,130'Methods for producing image sensors having multi-purpose architecture'20148,773,563'Multi-purpose architecture for CCD image sensors'20148,760,543'Dark reference in CCD image sensors'20148,728,713'Stitching methods using multiple microlithographic expose tools'20148,728,722'Stitching methods using multiple microlithographic expose tools'20148,605,187'CCD image sensors having multiple lateral overflow drain regions for a horizontal shift register'20138,415,813'Identification of dies on a semiconductor wafer'20138,415,175'Identification of dies on a semiconductor wafer'20138,411,189'Multi-purpose architecture for CCD image sensors'20138,350,952'Image sensors with improved angle response'20138,134,630'System and method for draining residual charge from charge-coupled device (CCD) shift registers in image sensors having reset drains'20127,948,534'Charge-coupled device image sensor with vertical binning of same-color pixels'20117,893,981'Image sensor with variable resolution and sensitivity'20117,851,822'Full frame ITO pixel with improved optical symmetry'20107,790,496'Method of improving solid-state image sensor sensitivity'20107,672,518'Use of frequency transform in the analysis of image sensors'20107,672,519'Use of frequency transforms in the analysis of image sensors'20107,423,668'On-chip block balancing structure and method for multiple output image sensors'20087,414,655'Charge-coupled device having multiple readout paths for multiple outputs'20087,315,322'Method of testing the uniformity of an image sensor'20087,274,391'CCD having improved flushing by reducing power consumption and creating a uniform dark field while maintaining low dark current'20074,862,275'Readout of charge packets from area imager CCD using an inverter-chain shift register'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2011Patents assigned to EASTMAN KODAK CO (11)· patent assignee history
1989Based in Rochester, NY, US· patent location history
2007–2019Based in Ontario, NY, US· patent location history
2012–2014Patents assigned to MEISENZAHL ERIC J (11)· patent assignee history
2012–2014Patents assigned to TRUESENSE IMAGING INC (10)· patent assignee history
2013–2014Patents assigned to DORAN JAMES E (4)· patent assignee history
2013–2014Patents assigned to FABINSKI ROBERT P (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| EASTMAN KODAK CO | 11 | 1989–2011 |
| MEISENZAHL ERIC Jself | 11 | 2012–2014 |
| TRUESENSE IMAGING INC | 10 | 2012–2014 |
| DORAN JAMES E | 4 | 2013–2014 |
| FABINSKI ROBERT P | 4 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ontario, New York, US | 23 | 2007–2019 |
| Rochester, New York, US | 1 | 1989 |