Inventor
Jeffrey Blackwood
Inventor
Portland, OR, US
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties30%
H01JElectric discharge tubes or discharge lamps28%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
H01LSemiconductor devices9%
C23CCoating metallic material6%
G01RMeasuring electric variables4%
B05DProcesses for applying fluent materials to surfaces, in general3%
G01QScanning-probe techniques or apparatus3%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%
G06FElectric digital data processing1%
PatentTitleYear
11,062,879Face-on, gas-assisted etching for plan-view lamellae preparation202110,825,651Automated TEM sample preparation202010,546,719Face-on, gas-assisted etching for plan-view lamellae preparation202010,340,119Automated TEM sample preparation201910,026,590Fiducial design for tilted or glancing mill operations with a charged particle beam20189,741,536'High aspect ratio structure analysis'20179,696,372'Multidimensional structural access'20179,601,313'Automated TEM sample preparation'20179,488,554'Method and system for reducing curtaining in charged particle beam sample preparation'20169,412,560'Bulk deposition for tilted mill protection'20169,384,982'Depositing material into high aspect ratio structures'20169,378,925'TEM sample preparation'20169,336,985'Method for creating S/TEM sample and sample structure'20169,279,752'Method for preparing thin samples for TEM imaging'20169,177,760'TEM sample preparation'20159,111,720'Method for preparing samples for imaging'20159,006,651'Method for creating S/TEM sample and sample structure'20158,912,490'Method for preparing samples for imaging'20148,859,998'TEM sample preparation'20148,822,921'Method for preparing samples for imaging'20147,245,758'Whole-wafer photoemission analysis'20077,023,225'Wafer-mounted micro-probing platform'20066,817,004'Net segment analyzer for chip CAD layout'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2006Patents assigned to LSI LOGIC CORP (2)· patent assignee history
2004–2021Based in Portland, OR, US· patent location history
2014–2021Patents assigned to FEI CO (20)· patent assignee history
2014Patents assigned to BLACKWOOD JEFFREY (1)· patent assignee history
2014Patents assigned to BRAY MATTHEW (1)· patent assignee history
2014Patents assigned to BUGGE CLIFF (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FEI CO | 20 | 2014–2021 |
| LSI LOGIC CORP | 2 | 2004–2006 |
| BLACKWOOD JEFFREYself | 1 | 2014 |
| BRAY MATTHEW | 1 | 2014 |
| BUGGE CLIFF | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Portland, OR, US | 23 | 2004–2021 |