Inventor
Kazushi Yamanaka
Inventor
Sendai, JP
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
H03HImpedance networks, e.g. resonant circuits18%
G01QScanning-probe techniques or apparatus9%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
B82YSpecific uses or applications of nanostructures4%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves4%
H01LSemiconductor devices4%
A61BDiagnosis2%
G01BMeasuring length, thickness or similar linear dimensions2%
G01RMeasuring electric variables2%
PatentTitleYear
10,436,757Electrical signal processing device20199,726,709'Semiconductor chip and method for detecting disconnection of wire bonded to semiconductor chip'20178,559,696'Imaging method of structure defect, imaging device of structure defect, imaging method of bubble or lesion and imaging device of bubble or lesion'20138,220,310'Gas analyzer and method of gas analysis'20128,106,703'Booster circuit'20128,004,902'Nonvolatile semiconductor memory device'20117,647,814'Environment difference detector'20107,423,360'Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device'20087,408,285'Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device'20087,368,848'Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device'20087,368,847'Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device'20087,362,034'Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device'20087,247,969'Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device'20077,170,213'Surface acoustic wave element, electric signal processing apparatus using the surface acoustic wave element, environment evaluating apparatus using the electric signal processing apparatus, and analyzing method using the surface acoustic wave element'20076,983,644'Specimen observation method in atomic force microscopy and atomic force microscope'20066,566,787'Elastic surface-wave device'20036,006,593'Method using cantilever to measure physical properties'19995,804,708'Atomic force microscope and method of analyzing frictions in atomic force microscope'19985,503,010'Directional atomic force microscope and method of observing a sample with the microscope'19965,101,382'Acoustic imaging method and apparatus for nondestructive evaluation of materials'19924,825,423'Method of measuring microcrack depth'19894,524,621'Method for measurement of velocity of surface acoustic wave'1985Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1985–1999Patents assigned to AGENCY IND SCIENCE TECHN (5)· patent assignee history
1985–1996Patents assigned to MITI MINI INT TRADE & IND (4)· patent assignee history
1985–1989Based in Ibaraki, JP· patent location history
1992–1999Based in Tsukuba, JP· patent location history
2003–2010Patents assigned to TOPPAN PRINTING CO LTD (9)· patent assignee history
2003–2013Patents assigned to YAMANAKA KAZUSHI (4)· patent assignee history
2003–2019Based in Sendai, JP· patent location history
2006–2008Based in Miyagi, JP· patent location history
2011–2017Patents assigned to TOYOTA MOTOR CO LTD (3)· patent assignee history
2011–2012Based in Ichinomiya, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOPPAN PRINTING CO LTD | 9 | 2003–2010 |
| AGENCY IND SCIENCE TECHN | 5 | 1985–1999 |
| MITI MINI INT TRADE & IND | 4 | 1985–1996 |
| YAMANAKA KAZUSHIself | 4 | 2003–2013 |
| TOYOTA MOTOR CO LTD | 3 | 2011–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sendai, JP | 11 | 2003–2019 |
| Tsukuba, JP | 4 | 1992–1999 |
| Ichinomiya, JP | 2 | 2011–2012 |
| Miyagi, JP | 2 | 2006–2008 |
| Ibaraki, JP | 2 | 1985–1989 |