Inventor

Gun-Won Lee

Inventor

Kyungki-do, KR

Overview

2→

Patents

1998–2000

Patent span

Physics

Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables25%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein25%

G09GArrangements or circuits for control of indicating devices using static means to present variable information25%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1025%

PatentTitleYear

6,028,442'Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof'2000 5,844,421'Probe control method for leveling probe pins for a probe test sequence'1998

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1998Patents assigned to SAMSUNG ELECTRONIS CO LTD (1)· patent assignee history

1998–2000Based in Kyungki-do, KR· patent location history

2000Patents assigned to SAMSUNG ELECTRONICS CO LTD (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
SAMSUNG ELECTRONICS CO LTD	1	2000
SAMSUNG ELECTRONIS CO LTD	1	1998

Locations

Location	Patents	Span
Kyungki-do, KR	2	1998–2000