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Inventor

Paul Wieczorek

Inventor
San Jose, CA, US

Overview

2→
Patents
1996–2008
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables33%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices33%
H01JElectric discharge tubes or discharge lamps33%
PatentTitleYear
7,394,067'Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systems'20085,502,306'Electron beam inspection system and method'1996

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1996Patents assigned to KLA INSTR CORP (1)· patent assignee history
1996–2008Based in San Jose, CA, US· patent location history
2008Patents assigned to KLA TENCOR TECH CORP (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KLA INSTR CORP11996
KLA TENCOR TECH CORP12008
Locations
LocationPatentsSpan
San Jose, California, US21996–2008