Inventor
MATTHEW SENDELBACH
Inventor
US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions17%
H01JElectric discharge tubes or discharge lamps17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G05BControl or regulating systems in general11%
G06TImage data processing or generation, in general11%
H01LSemiconductor devices11%
Y02PClimate change mitigation technologies in the production or processing of goods6%
PatentTitleYear
11,885,737Method and system for optical characterization of patterned samples202411,710,616TEM-based metrology method and system202311,450,541Metrology method and system202211,309,162TEM-based metrology method and system202211,300,948Process control of semiconductor fabrication based on spectra quality metrics202211,295,969Hybridization for characterization and metrology2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2024Patents assigned to NOVA LTD (5)· patent assignee history
2022Patents assigned to GLOBALFOUNDRIES INC (1)· patent assignee history
2022Patents assigned to IBM (1)· patent assignee history
2022–2024Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NOVA LTD | 5 | 2022–2024 |
| GLOBALFOUNDRIES INC | 1 | 2022 |
| IBM | 1 | 2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 6 | 2022–2024 |