Inventor
Peter Hoefer
Inventor
San Francisco, CA, US
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables33%
G01NInvestigating or analysing materials by determining their chemical or physical properties24%
H01PWaveguides14%
G01QScanning-probe techniques or apparatus5%
G01VGeophysics5%
G02CSpectacles5%
LOCD25%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
Y10TTechnical subjects covered by former us classification5%
PatentTitleYear
10,656,230EPR resonator with extended transparency and homogeneity in RF range202010,353,027EPR microwave cavity for small magnet airgaps20197,919,963'Magnetic resonance resonator assembly'20117,436,181'Probe head for nuclear magnetic resonance measurements'20087,391,212'Resonator apparatus for electron spin resonance (ESR) measurements and method for measuring electron spin resonance (ESR) signals'20085,789,257'Method and apparatus for measuring samples and for localizing a first substance within a surrounding second substance by means of nuclear magnetic resonance'19985,619,139'Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof'19974,618,228'Bifocal contact lens of the bivisual type'1986D0282352'Horizontal gel slab electrophoresis unit'19864,560,459'Vertical gel sandwich for use in electrophoresis and method therefor'1985D0269123'Electrophoresis apparatus'19834,325,796'Vertical gel slab electrophoresis apparatus and method therefor'19824,292,161'Vertical gel slab electrophoresis apparatus'19814,290,871'Vertical gel slab electrophoresis method'19814,224,134'Vertical gel slab electrophoresis apparatus and method therefor'1980Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1980–1985Patents assigned to HOEFER SCIENTIFIC INSTR (5)· patent assignee history
1980–1986Based in San Francisco, CA, US· patent location history
1983–1986Patents assigned to HOEFER SCIENT INSTRUMENTS (2)· patent assignee history
1986Based in Aschaffenburg, DE· patent location history
1997–1998Patents assigned to BRUKER ANALYTISCHE MESSTECHNIK (2)· patent assignee history
1997–1998Based in Karlsruhe, DE· patent location history
2008–2020Patents assigned to BRUKER BIOSPIN GMBH (4)· patent assignee history
2008Patents assigned to ENGELKE FRANK (1)· patent assignee history
2008–2020Based in Ettlingen, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HOEFER SCIENTIFIC INSTR | 5 | 1980–1985 |
| BRUKER BIOSPIN GMBH | 4 | 2008–2020 |
| BRUKER ANALYTISCHE MESSTECHNIK | 2 | 1997–1998 |
| HOEFER SCIENT INSTRUMENTS | 2 | 1983–1986 |
| ENGELKE FRANK | 1 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Francisco, California, US | 7 | 1980–1986 |
| Ettlingen, DE | 5 | 2008–2020 |
| Karlsruhe, DE | 2 | 1997–1998 |
| Aschaffenburg, DE | 1 | 1986 |