Inventor
HIROYA KANO
Inventor
JP
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
G01BMeasuring length, thickness or similar linear dimensions16%
G02BOptical elements, systems or apparatus16%
H04NPictorial communication, e.g. television13%
G06TImage data processing or generation, in general7%
G01MTesting static or dynamic balance of machines or structures4%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them4%
B25JManipulators2%
G01CMeasuring distances, levels or bearings2%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
PatentTitleYear
12,560,790Optical measurement method, optical measurement apparatus, and non-transitory storage medium storing optical measurement program202612,510,468Non-transitory storage medium, optical inspection system, processing apparatus for optical inspection system, and optical inspection method202512,461,026Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus202512,422,381Optical inspection method and storage medium, and optical inspection apparatus that uses the same202512,379,323Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus202512,366,526Optical test apparatus and optical test method202512,188,876Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus202512,136,238Processing device relating to inspection of inspection object, inspection system of inspection object, processing method relating to inspection of inspection object, and non-transitory storage medium202412,123,703Optical apparatus, optical inspection method and non-transitory storage medium202411,977,182Optical imaging apparatus, robot hand, moving body, and LiDAR apparatus202411,906,439Optical inspection method, non-transitory storage medium storing optical inspection program, and optical inspection apparatus202411,758,278Optical apparatus202311,693,162Optical test apparatus and optical test method202311,536,652Optical test apparatus and optical test method202211,415,510Optical inspection apparatus202211,333,492Optical device, information processing method, and computer program product202211,297,308Optical test apparatus and optical test method2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2026Patents assigned to TOSHIBA KK (17)· patent assignee history
2022–2026Based in JP· patent location history
2024–2025Patents assigned to TOSHIBA DIGITAL SOLUTIONS CORP (2)· patent assignee history
2024Patents assigned to KAUSHIKI KAISHA TOSHIBA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA KK | 17 | 2022–2026 |
| TOSHIBA DIGITAL SOLUTIONS CORP | 2 | 2024–2025 |
| KAUSHIKI KAISHA TOSHIBA | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 17 | 2022–2026 |