Inventor
Avner Karpol
Inventor
Nes Ziona, IL
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices32%
G01NInvestigating or analysing materials by determining their chemical or physical properties26%
G02BOptical elements, systems or apparatus26%
A61BDiagnosis6%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light3%
H02PControl or regulation of electric motors, electric generators or dynamo-electric converters3%
H04NPictorial communication, e.g. television3%
PatentTitleYear
7,463,352'Method and apparatus for article inspection including speckle reduction'20087,133,548'Method and apparatus for reticle inspection using aerial imaging'20066,924,891'Method and apparatus for article inspection including speckle reduction'20056,798,505'Method and apparatus for article inspection including speckle reduction'20046,735,331'Method and apparatus for early detection and classification of retinal pathologies'20046,587,194'Method of and apparatus for article inspection including speckle reduction'20036,556,294'Method of and apparatus for article inspection including speckle reduction'20036,466,315'Method and system for reticle inspection by photolithography simulation'20026,429,931'Method and apparatus for article inspection including speckle reduction'20026,369,888'Method and apparatus for article inspection including speckle reduction'20026,268,093'Method for reticle inspection using aerial imaging'20016,267,477'Three dimensional imaging apparatus and a method for use thereof'20015,311,111'Method of calibrating a step motor'19945,140,608'Optical system for focusing a light beam on to an image plane'19924,555,727'Optical scanning apparatus'1985Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1985Patents assigned to OPTROTECH LTD (1)· patent assignee history
1985–2008Based in Nes Ziona, IL· patent location history
1992Patents assigned to OPTROTECH LTD ISRAEL COMPANY (1)· patent assignee history
1992–1994Based in Tel Aviv, IL· patent location history
1994Patents assigned to ORBOTECH LTD (1)· patent assignee history
2001–2008Patents assigned to APPLIED MATERIALS INC (10)· patent assignee history
2001–2004Patents assigned to TALIA TECHNOLOGY LTD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 10 | 2001–2008 |
| TALIA TECHNOLOGY LTD | 2 | 2001–2004 |
| OPTROTECH LTD | 1 | 1985 |
| OPTROTECH LTD ISRAEL COMPANY | 1 | 1992 |
| ORBOTECH LTD | 1 | 1994 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nes Ziona, IL | 13 | 1985–2008 |
| Tel Aviv, IL | 2 | 1992–1994 |