Inventor

Yasutaka Ito

Inventor

Gifu, JP

Overview

1995–2021

Patent span

Electricity

Primary field (CPC H)

Patents· 85 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Pprimary

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%

H05BElectric heating11%

Y10TTechnical subjects covered by former us classification9%

H04NPictorial communication, e.g. television6%

G06FElectric digital data processing5%

C04BLime, magnesia5%

H04LTransmission of digital information, e.g. telegraphic communication3%

H01JElectric discharge tubes or discharge lamps2%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h102%

B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form2%

PatentTitleYear

11,047,927Displacement detector device2021 11,010,853Server device, trunk share system, information processing method, and non-transitory computer-readable medium storing information processing program2021 11,006,163Information processing apparatus and information processing method2021 10,988,129Operating portion control device, vehicle control system, and operating portion control method2021 10,971,278Superconducting wire and superconducting coil2021 10,964,454Superconducting wire and superconducting coil2021 10,964,453Superconducting stabilization material, superconducting wire, and superconducting coil2021 10,958,736Information processing apparatus, method of controlling the information processing apparatus, and storage medium2021 10,919,494Distribution device, key information sharing system, method of controlling distribution device, and recording medium2021 10,922,910Key information sharing system, delivery device and user terminal2021 10,910,132Superconducting wire and superconducting coil2021 10,901,826Image processing apparatus, control method of image processing apparatus to import setting file and analyze setting value for determining whether communication test is require to execute2021 10,874,998Diffusing member, exhaust gas purification device, and use of diffusing member in exhaust gas purification device2020 10,802,771Information processing apparatus, image control method and non-transitory computer-readable recording medium encoded with image control program2020 10,715,489Management server, connection support method, and non-transitory computer-readable recording medium encoded with connection support program2020 10,657,256Information processing system controlling performance of virus detection processing at devices included in the system, and information processing apparatus and recording medium2020 10,650,291Device for simulating an image forming apparatus2020 10,484,571Multifunction device, reboot method, and non-transitory recording medium storing computer readable program2019 10,230,871Information processing apparatus, conference support method, and recording medium2019 10,069,990Image processing apparatus, method of controlling the same, and recording medium for selectively processing packets using a processor or a sub processor2018 10,003,707Image processing apparatus and recording medium2018 9,959,402Image processing system, image formation apparatus, and relay device2018 9,922,794'Rotating anode X-ray tube'2018 9,811,294'Relay device, image forming apparatus, relay method, and non-transitory computer-readable recording medium encoded with relay program'2017 9,785,394'Image processing system, image processing apparatus, mobile terminal, and program for transmission of image data'2017 9,606,757'Management system, image processing apparatus, non-transitory computer-readable recording medium encoded with protocol sharing program, and protocol sharing method'2017 9,569,145'Gateway apparatus'2017 9,563,389'Image processing system, gateway apparatus, server apparatus, method of controlling gateway apparatus, method of controlling server apparatus, program for controlling gateway apparatus, and program for controlling server apparatus wherein the job includes an operation related to the job'2017 9,549,096'Image processing system, relay server, and program for relaying communications'2017 9,546,820'Annular structure having excellent heat insulating and heat releasing properties'2017 9,486,739'Holding seal material, manufacturing method for holding seal material, exhaust gas purification apparatus and manufacturing method for exhaust gas purification apparatus'2016 9,264,563'Communication system, management server, communication relay apparatus, and recording medium'2016 8,916,246'Annular structure having excellent heat insulating and heat releasing properties'2014 8,844,576'Exhaust pipe'2014 8,582,722'Rotary anode X-ray tube'2013 8,201,584'Exhaust pipe'2012 7,801,278'Rotary anode X-ray tube'2010 7,746,982'Rotary anode X-ray tube'2010 7,718,252'Inorganic fiber article'2010 7,697,665'Rotating anode X-ray tube'2010 7,084,376'Semiconductor production device ceramic plate'2006 7,078,655'Ceramic substrate, ceramic heater, electrostatic chuck and wafer prober for use in semiconductor producing and inspecting devices'2006 7,071,551'Device used to produce or examine semiconductors'2006 7,015,166'Carbon-containing aluminum nitride sintered compact and ceramic substrate for use in equipment for manufacturing or inspecting semiconductor'2006 7,011,874'Ceramic substrate for semiconductor production and inspection devices'2006 6,967,312'Semiconductor manufacturing/testing ceramic heater, production method for the ceramic heater and production system for the ceramic heater'2005 6,964,812'Carbon-containing aluminum nitride sintered compact and ceramic substrate for use in equipment for manufacturing or inspecting semiconductor'2005 6,960,743'Ceramic substrate for semiconductor manufacturing, and method of manufacturing the ceramic substrate'2005 6,956,186'Ceramic heater'2005 6,936,343'Ceramic substrate'2005 6,929,874'Aluminum nitride sintered body, ceramic substrate, ceramic heater and electrostatic chuck'2005 6,924,464'Ceramic heater and manufacturing method of ceramic heater'2005 6,921,881'Ceramic joint body'2005 6,919,124'Ceramic substrate'2005 6,917,020'Ceramic heater'2005 6,900,149'Carbon-containing aluminum nitride sintered compact and ceramic substrate for use in equipment for manufacturing or inspecting semiconductor'2005 6,897,414'Ceramic heater for semiconductor manufacturing/testing apparatus'2005 6,891,263'Ceramic substrate for a semiconductor production/inspection device'2005 6,888,236'Ceramic substrate for manufacture/inspection of semiconductor'2005 6,887,316'Ceramic heater'2005 6,884,972'Ceramic plate for a semiconductor producing/inspecting apparatus'2005 6,878,907'Ceramic substrate and process for producing the same'2005 6,878,906'Ceramic heater for semiconductor manufacturing and inspecting equipment'2005 6,861,165'Aluminum nitride sintered compact, ceramic substrate, ceramic heater and electrostatic chuck'2005 6,861,620'Ceramic heater'2005 6,849,938'Ceramic substrate for semiconductor production and inspection'2005 6,835,916'Ceramic heater'2004 6,825,555'Hot plate'2004 6,815,646'Ceramic substrate for semiconductor manufacture/inspection apparatus, ceramic heater, electrostatic clampless holder, and substrate for wafer prober'2004 6,809,299'Hot plate for semiconductor manufacture and testing'2004 6,753,601'Ceramic substrate for semiconductor fabricating device'2004 6,731,496'Electrostatic chuck'2004 6,717,116'Semiconductor production device ceramic plate'2004 6,710,307'Ceramic heater'2004 6,686,570'Hot plate unit'2004 6,677,557'Ceramic heater'2004 6,646,236'Hot plate unit'2003 6,639,191'Hot plate unit'2003 6,639,188'Ceramic heater'2003 6,632,512'Ceramic substrate'2003 6,507,006'Ceramic substrate and process for producing the same'2003 6,465,763'Ceramic heater'2002 5,737,018'Exposure apparatus and method for vibration control system'1998 5,559,555'Apparatus for performing exposure control pertaining to the luminance level of an object'1996 5,473,374'Exposing apparatus for performing exposure control corresponding to the luminance level of an object'1995

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2002–2020Patents assigned to IBIDEN CO LTD (48)· patent assignee history

2002–2006Based in Gifu, JP· patent location history

2003–2017Based in Ibi-gun, JP· patent location history

2010–2018Patents assigned to TOSHIBA ELECTRON TUBES & DEVIC (4)· patent assignee history

2010–2018Based in Kawasaki, JP· patent location history

2012–2021Patents assigned to TOYOTA MOTOR CO LTD (6)· patent assignee history

2012–2014Patents assigned to ITO YASUTAKA (4)· patent assignee history

2016–2020Patents assigned to KONICA MINOLTA INC (16)· patent assignee history

2016–2020Based in Amagasaki, JP· patent location history

2021Based in Iwakura, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
IBIDEN CO LTD	48	2002–2020
KONICA MINOLTA INC	16	2016–2020
TOYOTA MOTOR CO LTD	6	2012–2021
ITO YASUTAKAself	4	2012–2014
TOSHIBA ELECTRON TUBES & DEVIC	4	2010–2018

Locations

Location	Patents	Span
Gifu, JP	35	2002–2006
Amagasaki, JP	13	2016–2020
Ibi-gun, JP	12	2003–2017
Iwakura, JP	5	2021
Kawasaki, JP	4	2010–2018