Inventor
Soonam Park
Inventor
Sunnyvale, CA, US
Overview
Patents· 50 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps30%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
H01LSemiconductor devices17%
C23CCoating metallic material13%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
C23FNon-mechanical removal of metallic material from surface3%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
B05BSpraying apparatus2%
H05BElectric heating2%
PatentTitleYear
10,796,922Systems and methods for internal surface conditioning assessment in plasma processing equipment202010,707,061Systems and methods for internal surface conditioning in plasma processing equipment202010,593,523Systems and methods for internal surface conditioning in plasma processing equipment202010,593,560Magnetic induction plasma source for semiconductor processes and equipment202010,550,472Flow control features of CVD chambers202010,551,328Ceramic ring test device202010,541,184Optical emission spectroscopic techniques for monitoring etching202010,522,371Systems and methods for improved semiconductor etching and component protection201910,504,754Systems and methods for improved semiconductor etching and component protection201910,504,697Particle generation suppresor by DC bias modulation201910,504,700Plasma etching systems and methods with secondary plasma injection201910,490,418Systems and methods for internal surface conditioning assessment in plasma processing equipment201910,468,285High temperature chuck for plasma processing systems201910,460,915Rotatable substrate support having radio frequency applicator201910,453,655Plasma reactor having digital control over rotation frequency of a microwave field with direct up-conversion201910,431,429Systems and methods for radial and azimuthal control of plasma uniformity201910,354,843Chemical control features in wafer process equipment201910,340,124Generalized cylindrical cavity system for microwave rotation and impedance shifting by irises in a power-supplying waveguide201910,319,649Optical emission spectroscopy (OES) for remote plasma monitoring201910,153,133Plasma reactor having digital control over rotation frequency of a microwave field with direct up-conversion201810,032,606Semiconductor processing with DC assisted RF power for improved control20189,978,564Chemical control features in wafer process equipment20189,966,240Systems and methods for internal surface conditioning assessment in plasma processing equipment20189,947,549Cobalt-containing material removal20189,922,840'Adjustable remote dissociation'20189,892,888'Particle generation suppresor by DC bias modulation'20189,874,524In-situ spatially resolved plasma monitoring by using optical emission spectroscopy20189,846,130Ceramic ring test device20179,837,249Radial waveguide systems and methods for post-match control of microwaves20179,773,648'Dual discharge modes operation for remote plasma'20179,728,437'High temperature chuck for plasma processing systems'20179,711,366'Selective etch for metal-containing materials'20179,659,753'Grooved insulator to reduce leakage current'20179,593,421'Particle generation suppressor by DC bias modulation'20179,564,296'Radial waveguide systems and methods for post-match control of microwaves'20179,472,417'Plasma-free metal etch'20169,460,898'Plasma generation chamber with smooth plasma resistant coating'20169,384,997'Dry-etch selectivity'20169,373,517'Semiconductor processing with DC assisted RF power for improved control'20169,355,922'Systems and methods for internal surface conditioning in plasma processing equipment'20169,299,538'Radial waveguide systems and methods for post-match control of microwaves'20169,299,537'Radial waveguide systems and methods for post-match control of microwaves'20169,299,582'Selective etch for metal-containing materials'20169,132,436'Chemical control features in wafer process equipment'20159,117,855'Polarity control for remote plasma'20158,969,212'Dry-etch selectivity'20158,894,767'Flow control features of CVD chambers'20147,989,365'Remote plasma source seasoning'20117,799,704'Gas baffle and distributor for semiconductor processing chamber'20107,740,706'Gas baffle and distributor for semiconductor processing chamber'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2020Patents assigned to APPLIED MATERIALS INC (50)· patent assignee history
2010–2020Based in Sunnyvale, CA, US· patent location history
2011–2018Based in Mountain View, CA, US· patent location history
2014Patents assigned to CHEN XINGLONG (1)· patent assignee history
2014Patents assigned to CHUC KIEN N (1)· patent assignee history
2014Patents assigned to KHAN ADIB (1)· patent assignee history
2014Patents assigned to LIANG QIWEI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 50 | 2010–2020 |
| CHEN XINGLONG | 1 | 2014 |
| CHUC KIEN N | 1 | 2014 |
| KHAN ADIB | 1 | 2014 |
| LIANG QIWEI | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sunnyvale, California, US | 44 | 2010–2020 |
| Mountain View, California, US | 6 | 2011–2018 |