Inventor
Peter Rosenthal
Inventor
West Simsbury, CT, US
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions15%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light12%
A61KPreparations for medical, dental or toiletry purposes8%
A61PSpecific therapeutic activity of chemical compounds or medicinal preparations8%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry8%
C07KPeptides8%
H01JElectric discharge tubes or discharge lamps8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
B23KSoldering or unsoldering4%
C23CCoating metallic material4%
PatentTitleYear
11,005,227Multi-wavelength adjustable-radial-mode fiber laser202110,505,331Wavelength discriminating slab laser20199,574,017'Peptides having binding affinity to an antibody which recognizes an epitope on an α1 loop 2 or β2 loop 1 of an adrenoreceptor'20178,687,661'Pulsed CO2 laser output-pulse shape and power control'20148,455,442'Peptides having binding affinity to an antibody which recognizes an epitope on an α1 loop 2 or β2 loop 1 of an adrenoreceptor'20138,362,428'Transmission electron microscope'20137,839,509'Method of measuring deep trenches with model-based optical spectroscopy'20107,155,363'Thermal imaging for semiconductor process monitoring'20066,485,872'Method and apparatus for measuring the composition and other properties of thin films utilizing infrared radiation'20026,192,287'Method and apparatus for fault detection and control'20016,161,054'Cell control method and apparatus'20005,900,633'Spectrometric method for analysis of film thickness and composition on a patterned sample'19995,604,581'Film thickness and free carrier concentration analysis method and apparatus'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2001Patents assigned to ON LINE TECHN INC (4)· patent assignee history
1997–2021Based in West Simsbury, CT, US· patent location history
2002–2006Patents assigned to MKS INSTR INC (2)· patent assignee history
2010Patents assigned to ADVANCED METROLOGY SYSTEMS LLC (1)· patent assignee history
2013–2014Patents assigned to ROSENTHAL PETER (3)· patent assignee history
2013Based in Lüdenscheid, DE· patent location history
2013Based in London, GB· patent location history
2014Patents assigned to ALLIE DAVID (1)· patent assignee history
2017Based in Ludenscheid, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ON LINE TECHN INC | 4 | 1997–2001 |
| ROSENTHAL PETERself | 3 | 2013–2014 |
| MKS INSTR INC | 2 | 2002–2006 |
| ADVANCED METROLOGY SYSTEMS LLC | 1 | 2010 |
| ALLIE DAVID | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| West Simsbury, CT, US | 10 | 1997–2021 |
| Ludenscheid, DE | 1 | 2017 |
| Lüdenscheid, DE | 1 | 2013 |
| London, GB | 1 | 2013 |