Inventor
Yi-Wei Liu
Inventor
New Taipei, TW
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus14%
H01LSemiconductor devices12%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1012%
H04NPictorial communication, e.g. television8%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them6%
H05KPrinted circuits6%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%
G06FElectric digital data processing4%
H01QAntennas, i.e. radio aerials4%
PatentTitleYear
10,790,254Chip package structure202010,684,477Near-eye display device and methods with coaxial eye imaging202010,615,841Conformal shielding for a diversity receive module202010,409,078Lensed beam-splitter prism array and associated method201910,400,567Pipeline descaling and rock stratum fracturing device based on electro-hydraulic pulse shock waves201910,200,077Shielded diversity receive module201910,192,785Devices and methods related to fabrication of shielded modules201910,044,948Image sensor global shutter supply circuit with variable bandwidth20189,958,680Near-eye display device and methods with coaxial eye imaging20189,838,623Global shutter control signal generator with reduced driving requirements20179,753,298'Reducing speckle in projected images'20179,740,030'Near-eye display systems, devices and methods'20179,666,536'Package structure and fabrication method thereof'20179,607,974'Package structure and fabrication method thereof'20179,448,415'Spatially interleaved polarization converter for LCOS display'20167,582,868'Method of nano thin film thickness measurement by auger electron spectroscopy'20097,237,900'Polarization conversion system'20076,896,372'Off-axis image projecting system'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009Patents assigned to SAE MAGNETICS HK LTD (1)· patent assignee history
2016–2020Patents assigned to OMNIVISION TECH INC (8)· patent assignee history
2016–2020Based in New Taipei, TW· patent location history
2017Patents assigned to SILICONWARE PRECISION INDUSTRIES CO LTD (2)· patent assignee history
2017–2020Based in Taichung, TW· patent location history
2017–2018Based in Shanghai, CN· patent location history
2019–2020Patents assigned to SKYWORKS SOLUTIONS INC (3)· patent assignee history
2019–2020Based in San Diego, CA, US· patent location history
2019Based in Hubei, CN· patent location history
2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OMNIVISION TECH INC | 8 | 2016–2020 |
| SKYWORKS SOLUTIONS INC | 3 | 2019–2020 |
| SILICONWARE PRECISION INDUSTRIES CO LTD | 2 | 2017 |
| SAE MAGNETICS HK LTD | 1 | 2009 |
| TAIWAN SEMICONDUCTOR MFG CO LTD | 1 | 2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| New Taipei, TW | 6 | 2016–2020 |
| Taichung, TW | 3 | 2017–2020 |
| San Diego, California, US | 3 | 2019–2020 |
| Shanghai, CN | 2 | 2017–2018 |
| Hubei, CN | 1 | 2019 |