Inventor
Masashi Iwatsuki
Inventor
Tokyo, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus13%
H01JElectric discharge tubes or discharge lamps13%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests13%
B01LChemical or physical laboratory apparatus for general use7%
B82YSpecific uses or applications of nanostructures7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G01RMeasuring electric variables7%
H01LSemiconductor devices7%
H02NElectric machines not otherwise provided for7%
H10DInorganic electric semiconductor devices7%
PatentTitleYear
9,972,705Method for manufacturing semiconductor device20187,095,024'TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope'20065,128,544'Scanning probe microscope'19924,894,538'Scanning device for scanning tunneling microscope'1990Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1990–2006Patents assigned to JEOL LTD (3)· patent assignee history
1990Patents assigned to RION CO (1)· patent assignee history
1990–2006Based in Tokyo, JP· patent location history
1992Based in Mizuho, JP· patent location history
2018Patents assigned to DENSO CORP (1)· patent assignee history
2018Based in Kariya, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| JEOL LTD | 3 | 1990–2006 |
| DENSO CORP | 1 | 2018 |
| RION CO | 1 | 1990 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 2 | 1990–2006 |
| Kariya, JP | 1 | 2018 |
| Mizuho, JP | 1 | 1992 |