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Inventor

Ahmad A. Alyamani

Inventor
Santa Clara, CA, US

Overview

2→
Patents
2007–2008
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
7,328,386'Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuits'20087,206,983'Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuits'2007

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2007–2008Patents assigned to LSI LOGIC CORP (2)· patent assignee history
2007–2008Based in Santa Clara, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
LSI LOGIC CORP22007–2008
Locations
LocationPatentsSpan
Santa Clara, California, US22007–2008