Inventor
Shinobu Otsuka
Inventor
Hitachinaka, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables67%
H01JElectric discharge tubes or discharge lamps33%
PatentTitleYear
7,642,796'Control system and method of semiconductor inspection system'20107,196,533'Control system and method of semiconductor inspection system'2007D0360598'Console for measurement scanner for semi-conductor'19955,001,344'Scanning electron microscope and method of processing the same'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991–1995Patents assigned to HITACHI LTD (2)· patent assignee history
1991–1995Based in Katsuta, JP· patent location history
2007–2010Patents assigned to HITACHI HIGH TECH CORP (2)· patent assignee history
2007–2010Based in Hitachinaka, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 2 | 2007–2010 |
| HITACHI LTD | 2 | 1991–1995 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachinaka, JP | 2 | 2007–2010 |
| Katsuta, JP | 2 | 1991–1995 |