LexDanaLexDanabeta
Inventor

Peter A. Levine

Inventor
West Windsor, NJ, US

Overview

90→
Patents
1976–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 90 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary
H04NPictorial communication, e.g. television39%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation18%
H10DInorganic electric semiconductor devices8%
G11CStatic stores7%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
C07DHeterocyclic compounds2%
Y10TTechnical subjects covered by former us classification2%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms2%
G01NInvestigating or analysing materials by determining their chemical or physical properties2%
PatentTitleYear
10,535,690Extended dynamic range imaging sensor and operating mode of the same202010,257,448Extended dynamic range imaging sensor and operating mode of the same201910,039,486Means and methods for facilitating trauma integration20188,987,647'Low power wide dynamic range CMOS imager output circuit having a threshold detector to set a gain to be applied by a readout circuitry'20158,946,818'Dark current reduction in back-illuminated imaging sensors'20158,830,360'Method and apparatus for optimizing image quality based on scene content'20148,766,157'High dynamic range CMOS pixel and method of operating same'20148,654,232'Night vision CMOS imager with optical pixel cavity'20148,558,160'CMOS imager with companded column signals'20138,432,150'Methods for operating an array column integrator'20138,432,149'Array column integrator'20138,421,437'Array column integrator'20138,178,914'Method of fabricating back-illuminated imaging sensors'20127,948,536'Gain matching for electron multiplication imager'20117,932,575'Method of fabricating back-illuminated imaging sensors using a bump bonding technique'20117,855,128'Back-illuminated imager using ultra-thin silicon on insulator substrates'20107,830,431'Simultaneous readout of CMOS APS imagers'20107,777,229'Method and apparatus for reducing smear in back-illuminated imaging sensors'20107,723,215'Dark current reduction in back-illuminated imaging sensors and method of fabricating same'20107,622,342'Method of fabricating back-illuminated imaging sensors'20097,554,590'Simultaneous readout of CMOS APS imagers'20097,541,256'Method of fabricating back-illuminated imaging sensors using a bump bonding technique'20097,378,634'Imaging methods and apparatus having extended dynamic range'20087,317,484'CMOS APS readout scheme that combines reset drain current and the source follower output'20087,265,397'CCD imager constructed with CMOS fabrication techniques and back illuminated imager with improved light capture'20077,265,828'Spectroscopy imager methods and apparatus having extended dynamic range'20077,129,975'Addressable imager with real time defect detection and substitution'20067,020,353'Extended dynamic range imaging system and method'20066,924,887'Method and apparatus for generating charge from a light pulse'20056,657,706'Method and apparatus for resolving relative times-of-arrival of light pulses'20036,535,275'High resolution 3-D imaging range finder'20036,498,347'Infrared imager using room temperature capacitance sensor'20026,472,653'Method and apparatus to extend dynamic range of time delay and integrate charge coupled devices'20026,441,852'Extended dynamic range image sensor system'20026,433,326'CMOS/CCD line transfer imager with low dark current'20026,249,001'Infrared imager using room temperature capacitance sensor'20016,101,294'Extended dynamic imaging system and method'20006,040,570'Extended dynamic range image sensor system'20005,969,758'DC offset and gain correction for CMOS image sensor'19995,965,886'Infrared imager using room temperature capacitance sensor'19995,844,238'Infrared imager using room temperature capacitance sensor'19985,069,732'Hand-held laminating roller'1991D0307597'Hand-held laminating roller'19904,739,495'Solid-state imager defect corrector'19884,703,442'Temperature tracking defect corrector for a solid-state imager'19874,695,878'Color television camera with selectively removable infrared rejection filter'19874,677,490'CCD imager output signal processing using drain output signal and wide-band sampled detected floating-element output signal'19874,670,787'Suppression of field-rate brightness variations for a television camera'19874,661,788'Tapped CCD delay line with non-destructive charge sensing using floating diffusions'19874,656,518'Field-transfer CCD imagers with poly-phase image registers, operated to provide pseudo line interlace on alternate fields'19874,646,142'Method and apparatus for aligning solid-state imagers'19874,644,287'Low noise synchronous detection for a charge transfer device'19874,641,963'Back-illuminated CCD imager adapted for contrast transfer function measurements thereon'19874,622,580'Solid-state imager chip mounting'19864,608,606'CCD floating-element output stages providing low reset noise with single sampling'19864,600,946'Adaptive defect correction for solid-state imagers'19864,594,612'Transfer smear reduction in line transfer CCD imagers'19864,593,311'Electrical registration of CCD imagers'19864,580,170'Suppression of frame-rate flicker in CCD imagers using field interlace'19864,580,168'Charge-storage-well dark current accumulator with CCD circuitry'19864,567,524'Smear reduction in CCD imagers using empty well clocking'19864,562,475'DC Restoration of synchronously detected CCD imager output signals'19854,562,473'Dark current sensing with a solid-state imager having a CCD line register output'19854,556,851'Reduction of noise in signal from charge transfer devices'19854,551,762'Dark-current level regulation in solid-state devices'19854,549,215'Low noise black level reference for CCD imagers'19854,525,743'Dark current measurement and control for cameras having field-transfer CCD imagers'19854,524,450'Automatic adjustment of the amplitudes of plural-phase CCD clocking voltages'19854,499,497'CCD Imager with improved low light level response'19854,496,982'Compensation against field shading in video from field-transfer CCD imagers'19854,490,744'Smear reduction technique for CCD field-transfer imager system'19844,481,522'CCD Imagers with substrates having drift field'19844,437,764'Electrical compensation for misregistration of striped color filter in a color imager with discrete sampling elements'19844,435,730'Low noise CCD output'19844,412,190'Apparatus for processing CCD output signals'19834,404,587'Electrical compensation for misregistration of striped color filter in a color imager with discrete sampling elements'19834,348,690'Semiconductor imagers'19824,262,217'CCD gain control'19814,253,120'Defect detection means for charge transfer imagers'19814,223,234'Reduction of sparkle noise and mottling in CCD imagers'19804,206,372'Reduction of sparkle noise in CCD imagers'19804,191,896'Low noise CCD input circuit'19804,191,895'Low noise CCD input circuit'19804,158,209'CCD comb filters'19794,032,976'Smear reduction in CCD imagers'19774,010,319'Smear reduction in CCD imagers'19773,958,210'Charge coupled device systems'19763,953,733'Method of operating imagers'19763,931,463'Scene brightness compensation system with charge transfer imager'19763,931,465'Blooming control for charge coupled imager'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1976–1988Patents assigned to RCA CORP (47)· patent assignee history
1976–2001Based in Trenton, NJ, US· patent location history
1976Based in Kendall Park, NJ, US· patent location history
1983–2020Based in West Windsor, NJ, US· patent location history
1985–1988Based in Mercer County, NJ, US· patent location history
1999–2010Patents assigned to SARNOFF CORP (20)· patent assignee history
2011–2020Patents assigned to STANFORD RES INST INT (11)· patent assignee history
2012–2015Patents assigned to LEVINE PETER ALAN (6)· patent assignee history
2013–2018Patents assigned to LEVINE PETER (4)· patent assignee history
2013Based in Toronto, CA· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
RCA CORP471976–1988
SARNOFF CORP201999–2010
STANFORD RES INST INT112011–2020
LEVINE PETER ALANself62012–2015
LEVINE PETERself42013–2018
Locations
LocationPatentsSpan
West Windsor, New Jersey, US351983–2020
Trenton, New Jersey, US291976–2001
Mercer County, New Jersey, US151985–1988
Toronto, CA32013
Kendall Park, New Jersey, US31976