Inventor
Tatsuhiko Ueki
Inventor
Tokyo, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1015%
F28DHeat-exchange apparatus, not provided for in another subclass, in which the heat-exchange media do not come into direct contact10%
C22FChanging the physical structure of non-ferrous metals and non-ferrous alloys8%
G02BOptical elements, systems or apparatus8%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light8%
Y10TTechnical subjects covered by former us classification8%
A61CDentistry5%
C22CAlloys5%
A61BDiagnosis3%
A61FFilters implantable into blood vessels3%
PatentTitleYear
10,379,609Line-of-sight measurement device, line-of-sight measurement method and line-of-sight measurement program20197,403,347'Optical transmission module with temperature control'20086,871,701'Plate-type heat pipe and method for manufacturing the same'20056,856,475'Optical module having temperature adjustment features'20056,837,059'Temperature adjustment device and laser module'20056,807,208'Laser module'20046,381,845'Method of manufacturing plate type heat pipe'20026,317,322'Plate type heat pipe and a cooling system using same'20016,263,959'Plate type heat pipe and cooling structure using it'20016,256,201'Plate type heat pipe method of manufacturing same and cooling apparatus using plate type heat pipe'20015,951,793'Ni-Ti-Pd superelastic alloy material, its manufacturing method, and orthodontic archwire made of this alloy material'19995,885,381'Ni-Ti-Pd superelastic alloy material, its manufacturing method, and orthodontic archwire made of this alloy material'19995,850,837'Device for correcting an ingrown nail'19985,641,364'Method of manufacturing high-temperature shape memory alloys'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2008Patents assigned to FURUKAWA ELECTRIC CO LTD (12)· patent assignee history
1997–2008Based in Tokyo, JP· patent location history
1998Patents assigned to FURUKAWA TECHNO MAT CO LTD (1)· patent assignee history
1998Based in Yokohama, JP· patent location history
2002Patents assigned to FURAKAWA ELECTRIC CO LTD (1)· patent assignee history
2019Patents assigned to UNIV KOBE NAT UNIV CORP (1)· patent assignee history
2019Based in Hyogo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FURUKAWA ELECTRIC CO LTD | 12 | 1997–2008 |
| FURAKAWA ELECTRIC CO LTD | 1 | 2002 |
| FURUKAWA TECHNO MAT CO LTD | 1 | 1998 |
| UNIV KOBE NAT UNIV CORP | 1 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 12 | 1997–2008 |
| Hyogo, JP | 1 | 2019 |
| Yokohama, JP | 1 | 1998 |