Inventor
Hideki Mori
Inventor
Kanagawa, JP
Overview
Patents· 83 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices12%
G03GElectrography7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
H04NPictorial communication, e.g. television6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
A23DEdible oils or fats, e.g. margarines, shortenings or cooking oils3%
H10HInorganic light-emitting semiconductor devices having potential barriers3%
A23LFoods, foodstuffs or non-alcoholic beverages, not otherwise provided for2%
PatentTitleYear
10,361,183Electrostatic protective device and electrostatic protective circuit201910,319,602Substrate treatment method and substrate treatment apparatus201910,197,960Image forming apparatus including image projector201910,160,064Flux, solder paste and solder joint201810,068,161Apparatus and method for maintenance of an image forming apparatus20189,463,941'Sheet skew feeding correction device and image forming apparatus'20169,463,398'Bubble removal method and bubble removal device'20169,372,445'Image forming apparatus'20169,256,200'Image forming apparatus'20169,217,960'Image forming apparatus'20159,132,624'Contact pressure adjusting method and contact pressure adjusting apparatus for printing press'20158,919,771'Sheet conveying apparatus and image forming apparatus'20148,803,244'Semiconductor device'20148,753,431'Bubble removal method and bubble removal device'20148,716,811'Semiconductor device'20148,700,498'Feature analyzing apparatus for a surface of an object'20148,508,246'Substrate surface inspecting apparatus and substrate surface inspecting method'20138,497,985'Inspection method based on captured image and inspection device'20138,488,867'Inspection device for disk-shaped substrate'20138,463,161'Image forming apparatus having transfer belt spacing mechanism'20138,433,102'Surface roughness inspection system'20138,382,099'Sheet conveying apparatus and image forming apparatus'20138,300,954'Information processing apparatus and method, and program'20128,264,600'Image processing apparatus for converting a lower resolution image into a higher resolution image using cyclic coefficients'20128,227,314'Semiconductor device and manufacturing method of the same'20128,221,096'Compressor arrangement with stator welded to a housing'20128,208,735'Image processing device, image processing method, learning device, learning method, and program'20128,194,241'Apparatus and method for inspecting edge of semiconductor wafer'20128,111,325'Image processing apparatus and method and program'20128,107,064'Disc wafer inspecting device and inspecting method'20128,097,914'Semiconductor device and manufacturing method of the same'20128,094,923'Wafer containing cassette inspection device and method'20128,031,440'Coil support structure and magnetic disk drive'20118,023,111'Surface inspection apparatus'20117,944,657'Electrostatic discharge protection circuit'20117,781,861'Semiconductor device'20107,460,809'Air processing apparatus and image forming system'20087,332,862'Led lamp including a resist bonded to a copper film'20087,279,719'Light emitting diode'20077,122,861'Semiconductor device and manufacturing method thereof'20067,092,291'Nonvolatile semiconductor memory device, charge injection method thereof and electronic apparatus'20067,015,551'Semiconductor device and method of fabricating same'20067,009,259'Semiconductor device and method of fabricating same'20066,928,079'Multiplexer controlling absorption of delay fluctuation on individual transmission path'20056,903,424'Semiconductor device and its manufacturing method'20056,869,847'Semiconductor device manufacturing method thereof'20056,831,305'Semiconductor light-emitting device'20046,665,047'Image forming apparatus'20036,536,877'Printer, printer head, and method for fabricating printer head formed with a multilayer wiring pattern'20036,522,862'Compact image forming apparatus with vertical arrangement'20036,513,912'Heat generating element for printer head and manufacturing method therefor'20036,498,445'Oscillation apparatus for oscillating roller'20026,496,162'Light emitting diode display unit'20026,489,657'Semiconductor device with improved channel stopper'20026,477,345'Compact image forming apparatus'20026,473,576'Image forming apparatus with sheet feeding device having sheet supporting portion'20026,404,009'Semiconductor device and method of producing the same'20026,287,624'Foods containing fat or oil'20016,265,853'Power source unit for transferring energy between power sources that power an electric vehicle'20016,236,382'Light emitting diode display unit'20016,205,285'Video CD reproduction controlling device and its controlling method'20016,106,879'Fried food and shortening'20006,022,579'Water-in-oil emulsified fat composition'20005,936,289'Semiconductor device'19995,912,479'Heterojunction bipolar semiconductor device'19995,844,533'Gray scale liquid crystal display'19985,731,620'Semiconductor device with reduced parasitic substrate capacitance'19985,727,050'Communication device having a facsimile module for carrying out confidential communication'19985,487,903'Method for improving the qualities of meat and meat piece treated thereby'19965,465,102'Image display apparatus'19955,362,892'Phospholipid composition, fat and oil composition containing the same and process for producing phosphatidic acids'19945,347,294'Image display apparatus'19945,183,750'Processes for the production of phosphatidic acid'19935,105,739'Apparatus for controlling ink supply amounts of individual zones'19924,888,403'Process for producing plastic-like woody moldings from dibasic acid anhydrides and unsaturated monoglycidyl ethers'19894,634,784'Process for production of epichlorohydrin'19874,403,058'Two-part type (meth)acrylate adhesives having excellent storage stabilities'19834,324,815'Screen-printing mask and method'19824,303,464'Method of manufacturing gallium phosphide single crystals with low defect density'19814,242,401'Screen-printing mask'19804,160,116'Process for the production of alkylene glycols'19794,063,972'Method for growing epitaxial layers on multiple semiconductor wafers from liquid phase'19773,933,538'Method and apparatus for production of liquid phase epitaxial layers of semiconductors'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1992–2003Based in Ibaraki, JP· patent location history
1994–2012Based in Tokyo, JP· patent location history
1998–2014Patents assigned to SONY CORP (23)· patent assignee history
1998–2019Based in Kanagawa, JP· patent location history
2002–2019Patents assigned to CANON KK (14)· patent assignee history
2002–2019Based in Toride, JP· patent location history
2011–2019Patents assigned to SHIBAURA MECHATRONICS CORP (10)· patent assignee history
2011–2019Based in Yokohama, JP· patent location history
2012–2016Patents assigned to MORI HIDEKI (21)· patent assignee history
2012–2014Patents assigned to HAYASHI YOSHINORI (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SONY CORP | 23 | 1998–2014 |
| MORI HIDEKIself | 21 | 2012–2016 |
| CANON KK | 14 | 2002–2019 |
| SHIBAURA MECHATRONICS CORP | 10 | 2011–2019 |
| HAYASHI YOSHINORI | 8 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 24 | 1998–2019 |
| Toride, JP | 13 | 2002–2019 |
| Yokohama, JP | 10 | 2011–2019 |
| Ibaraki, JP | 8 | 1992–2003 |
| Tokyo, JP | 5 | 1994–2012 |