Inventor
Zhiwei Xu
Inventor
Sunnyvale, CA, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables29%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1021%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein6%
B05BSpraying apparatus3%
B05CApparatus for applying fluent materials to surfaces, in general3%
B08BCleaning in general3%
B29CShaping or joining of plastics3%
B29LIndexing scheme associated with subclass b29c, relating to particular articles3%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form3%
PatentTitleYear
10,710,126Cleaning apparatus and cleaning method202010,639,821Ultraviolet curing device, sealant curing system and sealant curing method202010,543,498Sealant coating nozzle and sealant coating apparatus202010,375,769High-speed locomotive windshield and preparation method therefor20197,719,294'Systems configured to perform a non-contact method for determining a property of a specimen'20107,538,333'Contactless charge measurement of product wafers and control of corona generation and deposition'20097,397,254'Methods for imperfect insulating film electrical thickness/capacitance measurement'20087,358,748'Methods and systems for determining a property of an insulating film'20087,248,062'Contactless charge measurement of product wafers and control of corona generation and deposition'20077,187,186'Methods and systems for determining one or more properties of a specimen'20077,110,238'Systems and methods for using non-contact voltage sensors and corona discharge guns'20067,103,484'Non-contact methods for measuring electrical thickness and determining nitrogen content of insulating films'20067,075,318'Methods for imperfect insulating film electrical thickness/capacitance measurement'20067,064,565'Methods and systems for determining an electrical property of an insulating film'20067,012,438'Methods and systems for determining a property of an insulating film'20066,909,291'Systems and methods for using non-contact voltage sensors and corona discharge guns'20056,759,255'Method and system for detecting metal contamination on a semiconductor wafer'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2010Patents assigned to KLA TENCOR TECH CORP (13)· patent assignee history
2004–2010Based in Sunnyvale, CA, US· patent location history
2019Patents assigned to BEIJING HANG BO NEW MATERIAL TECH CO LTD (1)· patent assignee history
2019Patents assigned to CHINA BUILDING MAT ACADEMY (1)· patent assignee history
2019–2020Based in Beijing, CN· patent location history
2020Patents assigned to BOE TECHNOLOGY GROUP CO LTD (3)· patent assignee history
2020Patents assigned to HEFEI BOE OPTOELECTRONICS TECH (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR TECH CORP | 13 | 2004–2010 |
| BOE TECHNOLOGY GROUP CO LTD | 3 | 2020 |
| HEFEI BOE OPTOELECTRONICS TECH | 3 | 2020 |
| BEIJING HANG BO NEW MATERIAL TECH CO LTD | 1 | 2019 |
| CHINA BUILDING MAT ACADEMY | 1 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sunnyvale, California, US | 13 | 2004–2010 |
| Beijing, CN | 4 | 2019–2020 |