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Inventor

Mihoko Akiyama

Inventor
Hyogo, JP

Overview

30→
Patents
1994–2018
Patent span
Physics
Primary field (CPC G)

Patents· 30 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores46%
G05FSystems for regulating electric or magnetic variables18%
H03KPulse technique8%
B41MPrinting, duplicating, marking, or copying processes6%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
Y10TTechnical subjects covered by former us classification4%
G01RMeasuring electric variables2%
H10BElectronic memory devices2%
H10DInorganic electric semiconductor devices2%
PatentTitleYear
10,121,541Semiconductor device and information processing system20189,620,214'Content addressable memory with reduced power consumption and increased search operation speed'20179,159,376'Content addressable memory device'20159,042,148'Content addressable memory'20158,780,599'Content addressable memory device'20148,638,583'Content addressable memory'20148,638,599'Semiconductor storage device'20148,599,639'Semiconductor device including internal voltage generation circuit'20138,451,678'Semiconductor device including internal voltage generation circuit'20138,400,803'Content addressable memory device'20138,310,852'Content addressable memory'20128,164,934'Content addressable memory'20128,004,923'Semiconductor device including internal voltage generation circuit'20117,656,736'Semiconductor device including internal voltage generation circuit'20107,408,818'Semiconductor device undergoing defect detection test'20087,023,754'Semiconductor device having standby mode and active mode'20066,781,431'Clock generating circuit'20046,777,707'Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing'20046,768,354'Multi-power semiconductor integrated circuit device'20046,700,434'Substrate bias voltage generating circuit'20046,614,270'Potential detecting circuit having wide operating margin and semiconductor device including the same'20036,515,461'Voltage downconverter circuit capable of reducing current consumption while keeping response rate'20036,472,926'Internal voltage generation circuit'20026,429,729'Semiconductor integrated circuit device having circuit generating reference voltage'20026,424,579'Semiconductor memory device with internal power supply potential generation circuit'20026,424,134'Semiconductor integrated circuit device capable of stably generating internal voltage independent of an external power supply voltage'20026,414,881'Semiconductor device capable of generating internal voltage effectively'20025,428,372'Multiple-use thermal image transfer recording method'19955,336,548'Multiple-use thermal image transfer recording medium'19945,324,585'Image receiving sheet for use in thermal image transfer recording system'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–1995Based in Susono, JP· patent location history
2002–2006Patents assigned to MITSUBISHI ELECTRIC ENG (12)· patent assignee history
2002–2004Patents assigned to MITSUBISHI ELECTRIC CORP (8)· patent assignee history
2002–2014Based in Hyogo, JP· patent location history
2004–2010Patents assigned to RENESAS TECH CORP (5)· patent assignee history
2004–2018Based in Tokyo, JP· patent location history
2008–2017Based in Itami, JP· patent location history
2011–2018Patents assigned to RENESAS ELECTRONICS CORP (13)· patent assignee history
2012–2014Patents assigned to AKIYAMA MIHOKO (5)· patent assignee history
2014–2015Based in Kanagawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
RENESAS ELECTRONICS CORP132011–2018
MITSUBISHI ELECTRIC ENG122002–2006
MITSUBISHI ELECTRIC CORP82002–2004
AKIYAMA MIHOKOself52012–2014
RENESAS TECH CORP52004–2010
Locations
LocationPatentsSpan
Hyogo, JP122002–2014
Itami, JP112008–2017
Susono, JP31994–1995
Tokyo, JP22004–2018
Kanagawa, JP22014–2015