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Inventor

Sergio Oritz Egea

Inventor
Madrid, ES

Overview

1→
Patents
2017
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

A61Bprimary
A61BDiagnosis33%
G01BMeasuring length, thickness or similar linear dimensions33%
G06TImage data processing or generation, in general33%
PatentTitleYear
9,593,933'Method for calibrating and correcting the scanning distortion of an optical coherence tomography system'2017

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2017Patents assigned to CONSEJO SUPERIOR DE INVESTIG CIENTIFICAS (CSIC) (1)· patent assignee history
2017Patents assigned to DORRONSORO DÍAZ CARLOS (1)· patent assignee history
2017Patents assigned to MARCOS CELESTINO SUSANA (1)· patent assignee history
2017Patents assigned to ORITZ EGEA SERGIO (1)· patent assignee history
2017Patents assigned to SIEDLECKI DAMIAN (1)· patent assignee history
2017Based in Madrid, ES· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CONSEJO SUPERIOR DE INVESTIG CIENTIFICAS (CSIC)12017
DORRONSORO DÍAZ CARLOS12017
MARCOS CELESTINO SUSANA12017
ORITZ EGEA SERGIOself12017
SIEDLECKI DAMIAN12017
Locations
LocationPatentsSpan
Madrid, ES12017