Inventor
Gerald Schonecker
Inventor
Munich, DE
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps100%
PatentTitleYear
8,963,083'Switchable multi perspective detector, optics therefore and method of operating thereof'20158,723,117'Switchable multi perspective detector, optics therefor and method of operating thereof'20147,468,517'Single stage charged particle beam energy width reduction system for charged particle beam system'20086,232,601'Dynamically compensated objective lens-detection device and method'20016,107,633'Electron beam lens'20006,104,034'Objective lens'20006,051,838'Optical unit'20005,895,919'Gun lens for generating a particle beam'19995,895,917'Detector objective lens'19995,780,859'Electrostatic-magnetic lens arrangement'19984,794,306'Flat picture-reproducing device'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988Based in Russelsheim, DE· patent location history
1998–2000Patents assigned to ACT ADVANCED CIRCUIT TESTING (3)· patent assignee history
1998–2015Based in Munich, DE· patent location history
1999–2001Patents assigned to ADVANTEST CORP (4)· patent assignee history
2008–2015Patents assigned to INTEGRATED CIRCUIT TESTING (3)· patent assignee history
2014–2015Patents assigned to LANIO STEFAN (2)· patent assignee history
2014–2015Patents assigned to SCHÖNECKER GERALD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANTEST CORP | 4 | 1999–2001 |
| ACT ADVANCED CIRCUIT TESTING | 3 | 1998–2000 |
| INTEGRATED CIRCUIT TESTING | 3 | 2008–2015 |
| LANIO STEFAN | 2 | 2014–2015 |
| SCHÖNECKER GERALDself | 2 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Munich, DE | 10 | 1998–2015 |
| Russelsheim, DE | 1 | 1988 |