Inventor
Eiji Hankui
Inventor
Tokyo, JP
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Qprimary
H01QAntennas, i.e. radio aerials20%
H04BTransmission14%
G01RMeasuring electric variables9%
H04MTelephonic communication9%
H05KPrinted circuits7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy5%
H01PWaveguides5%
LOC145%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution5%
PatentTitleYear
11,095,038Polarization control plate2021D0927468Antenna2021D0926736Antenna202110,930,989Structural body, laminated structure of structural body, and antenna structure202110,411,351Antenna and wireless communication device20199,225,049'Noise suppression structure'20158,760,117'Portable communication apparatus'20148,379,408'Electromagnetic shield structure, wireless device using the structure, and method of manufacturing electromagnetic shield'20138,200,297'Cellular phone'20127,994,753'Portable communication apparatus and a battery pack'20117,990,747'Semiconductor chip and semiconductor device'20117,504,837'Electrical characteristics measurement method and electrical characteristics measurement device'20097,164,898'Wireless portable device'20077,162,284'Mobile phone, analysis device included therein, and analysis method'20077,142,817'Portable telephone'20067,031,744'Compact cellular phone'20066,745,057'Portable telephone'20046,557,154'Printed circuit board design support system, printed circuit board design method and storage medium storing control program for same'20036,515,634'Structure for controlling the radiation pattern of a linear antenna'20035,789,929'Method and device for measuring the specific absorption rate of electric power in a simulated human body'19985,610,519'Device and method for measuring specific absorption rate of electromagnetic waves in models of human bodies'19975,514,971'Method and apparatus for testing an immunity to electromagnetic interference and apparatus for irradiating radio wave for immunity test'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2021Patents assigned to NEC CORP (22)· patent assignee history
1996–2021Based in Tokyo, JP· patent location history
2006Based in Minato-ku, JP· patent location history
2012–2015Patents assigned to HANKUI EIJI (4)· patent assignee history
2012Patents assigned to KOJIMA TAKUYA (1)· patent assignee history
2012Patents assigned to NAKAMURA SHINYA (1)· patent assignee history
2021Patents assigned to JAPAN AVIATION ELECTRONICS IND LTD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NEC CORP | 22 | 1996–2021 |
| HANKUI EIJIself | 4 | 2012–2015 |
| JAPAN AVIATION ELECTRONICS IND LTD | 2 | 2021 |
| KOJIMA TAKUYA | 1 | 2012 |
| NAKAMURA SHINYA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 21 | 1996–2021 |
| Minato-ku, JP | 1 | 2006 |