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Inventor

Satoru Kawamoto

Inventor
Kasugai, JP

Overview

56→
Patents
1990–2011
Patent span
Physics
Primary field (CPC G)

Patents· 56 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores44%
H03KPulse technique8%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein6%
G06FElectric digital data processing4%
H03BGeneration of oscillations, directly or by frequency-changing, by circuits employing active elements which operate in a non-switching manner4%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses4%
H05KPrinted circuits3%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
F02DControlling combustion engines2%
G01RMeasuring electric variables2%
PatentTitleYear
8,029,879'Display device having pair of glass substrates and method for cutting it'20118,023,341'Method and apparatus for address allotting and verification in a semiconductor device'20117,881,142'Storage device and control method thereof'20117,813,154'Method and apparatus for address allotting and verification in a semiconductor device'20107,764,560'Semiconductor memory device and refresh method for the same'20107,739,559'Semiconductor device and program data redundancy method therefor'20107,675,801'Semiconductor memory device and refresh method for the same'20107,580,308'Semiconductor memory device and refresh method for the same'20097,514,781'Circuit substrate and manufacturing method thereof'20097,495,990'Semiconductor memory device and method of controlling the semiconductor memory device'20097,492,232'Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuit'20097,433,219'Method and apparatus for address allotting and verification in a semiconductor device'20087,399,214'Method of manufacturing electron emission source'20087,358,778'Voltage detection circuit, semiconductor device, method for controlling voltage detection circuit'20087,281,180'Memory system and test method therefor'20077,266,019'Non-volatile memory device and erasing method therefor'20077,248,525'Semiconductor memory device and refresh method for the same'20077,245,549'Semiconductor memory device and method of controlling the semiconductor memory device'20077,239,210'Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuit'20077,142,468'Control method of semiconductor memory device and semiconductor memory device'20067,106,651'Semiconductor memory device and method of reading data from semiconductor memory device'20067,081,776'Voltage detection circuit, semiconductor device, method for controlling voltage detection circuit'20067,046,043'Current-voltage converter circuit and its control method'20067,042,300'Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuit'20066,972,487'Multi chip package structure having a plurality of semiconductor chips mounted in the same package'20056,956,777'Semiconductor memory device and control method thereof'20056,879,200'Delay circuit, semiconductor integrated circuit device containing a delay circuit and delay method'20056,847,540'Semiconductor memory device and control method thereof'20056,839,293'Word-line deficiency detection method for semiconductor memory device'20056,809,605'Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuit'20046,802,721'Electronic device in which a circuit board and an electric connector are electrically connected by a flexible printed wiring board'20046,795,328'Semiconductor memory device'20046,782,522'Semiconductor device having wide wiring pattern in outermost circuit'20046,717,868'Semiconductor memory device and control method thereof'20046,658,609'Semiconductor memory device with a test mode'20036,617,755'Piezoelectric actuator drive circuit and fuel injection system'20036,567,298'Semiconductor memory device and control method thereof'20036,515,928'Semiconductor memory device having a plurality of low power consumption modes'20036,501,691'Word-line deficiency detection method for semiconductor memory device'20026,490,215'Semiconductor memory device and refreshing method of semiconductor memory device'20026,418,072'Semiconductor integrated circuit'20026,411,346'Active matrix LCD in which a change in the storage capacitance Cs due to having multiple exposure regions is compensated for by a change in the coupling capacitance Cgd'20026,407,593'Electromagnetic load control apparatus having variable drive-starting energy supply'20026,297,999'Semiconductor memory device and method for setting stress voltage'20016,185,137'Semiconductor memory device with decreased current consumption'20016,128,238'Direct sensing semiconductor memory device'20006,084,384'Power supply circuit with auxiliary constant voltage circuit inhibit feature'20006,078,369'Method of fabricating an active matrix liquid crystal display with repeating repair line pattern'20006,023,310'Active matrix liquid crystal display with repeating repair line pattern'20005,557,582'Semiconductor memory device inhibiting invalid data from being output'19965,508,765'Matrix-addressed type display device'19965,394,373'Semiconductor memory having a high-speed address decoder'19955,335,206'Semiconductor storage device'19945,151,806'Liquid crystal display apparatus having a series combination of the storage capacitors'19925,117,388'Serial input/output semiconductor memory'19924,892,080'Ignition system for internal combustion engine'1990

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2007Patents assigned to FUJITSU LTD (26)· patent assignee history
1992–2008Patents assigned to MITSUBISHI ELECTRIC CORP (6)· patent assignee history
1992–2007Based in Owariasahi, JP· patent location history
1994–2010Based in Kasugai, JP· patent location history
2000–2009Patents assigned to DENSO CORP (6)· patent assignee history
2000–2009Based in Chita-gun, JP· patent location history
2000–2008Based in Tokyo, JP· patent location history
2006–2011Patents assigned to SPANSION LLC (11)· patent assignee history
2009–2010Patents assigned to FUJITSU MICROELECTRONICS LTD (4)· patent assignee history
2011Based in Aichi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJITSU LTD261992–2007
SPANSION LLC112006–2011
DENSO CORP62000–2009
MITSUBISHI ELECTRIC CORP61992–2008
FUJITSU MICROELECTRONICS LTD42009–2010
Locations
LocationPatentsSpan
Kasugai, JP371994–2010
Chita-gun, JP62000–2009
Tokyo, JP42000–2008
Owariasahi, JP31992–2007
Aichi, JP22011