Inventor

Mitsuyasu Ohta

Inventor

Osaka, JP

Overview

1994–2008

Patent span

Physics

Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables44%

G06FElectric digital data processing26%

G11CStatic stores13%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1010%

G11BInformation storage based on relative movement between record carrier and transducer3%

H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses3%

H10DInorganic electric semiconductor devices3%

PatentTitleYear

7,348,595'Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device'2008 7,302,658'Methods for evaluating quality of test sequences for delay faults and related technology'2007 7,203,913'Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same'2007 7,197,725'Semiconductor integrated circuit and testing method for the same'2007 7,171,600'Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device'2007 7,032,196'Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device'2006 6,734,549'Semiconductor device having a device for testing the semiconductor'2004 6,708,301'Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor'2004 6,651,206'Method of design for testability, test sequence generation method and semiconductor integrated circuit'2003 6,625,784'Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same'2003 6,615,389'Database for designing integrated circuit device, and method for designing integrated circuit device'2003 6,499,125'Method for inserting test circuit and method for converting test data'2002 6,271,677'Semiconductor integrated circuit and method for testing the semiconductor integrated circuit'2001 6,253,343'Method of design for testability test sequence generation method and semiconductor integrated circuit'2001 6,119,250'Semiconductor integrated circuit'2000 5,978,948'Semiconductor circuit system, method for testing semiconductor integrated circuits, and method for generating a test sequence for testing thereof'1999 5,617,427'Method for generating test sequences for detecting faults in target scan logical blocks'1997 5,483,543'Test sequence generation method'1996 5,305,328'Method of test sequence generation'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2008Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (18)· patent assignee history

1994–2008Based in Osaka, JP· patent location history

1996–2004Based in Katano, JP· patent location history

1997Patents assigned to MATSUSHITA ELECTCRIC IND CO LT (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD	18	1994–2008
MATSUSHITA ELECTCRIC IND CO LT	1	1997

Locations

Location	Patents	Span
Osaka, JP	17	1994–2008
Katano, JP	2	1996–2004