Inventor
JOHN J. HENCH
Inventor
US
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions27%
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
G06TImage data processing or generation, in general18%
H01JElectric discharge tubes or discharge lamps18%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices9%
PatentTitleYear
12,449,386Forward library based seeding for efficient X-ray scatterometry measurements202512,379,668Methods and systems for measurement of semiconductor structures with multi-pass statistical optimization202512,320,763Full beam metrology for x-ray scatterometry systems202511,313,816Full beam metrology for x-ray scatterometry systems2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to KLA CORP (4)· patent assignee history
2022–2025Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA CORP | 4 | 2022–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 4 | 2022–2025 |