Inventor
Takefumi Hayashi
Inventor
Tokyo, JP
Overview
Patents· 28 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis61%
G01BMeasuring length, thickness or similar linear dimensions15%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
A61FFilters implantable into blood vessels7%
G02BOptical elements, systems or apparatus7%
G06TImage data processing or generation, in general2%
PatentTitleYear
10,791,922Ophthalmological device and ophthalmological inspection system202010,743,760Ophthalmological device and ophthalmological inspection system202010,285,585Ophthalmic surgical apparatus and attachment for ophthalmic surgery201910,136,809Ophthalmic apparatus20189,980,643Ophthalmologic apparatus20189,949,635Ophthalmic surgical apparatus and attachment for ophthalmic surgery20189,615,734'Ophthalmologic apparatus'20179,526,416'Ophthalmologic apparatus'20168,801,180'Ophthalmic tomographic imager with corneo-retinal image analysis'20148,662,668'Fundus oculi observing device'20148,646,913'Optical image measuring device and control method thereof'20148,622,547'Fundus observation apparatus'20148,573,776'Fundus observation apparatus'20138,205,988'Stereomicroscope'20128,042,944'Apparatus and method for observing an eye, as well as OCT-module'20117,982,880'Optical image measurement device'20117,859,680'Optical image measurement device'20107,777,893'Optical image measurement device'20107,643,154'Optical image measurement device'20107,341,349'Ophthalmologic apparatus and ophthalmologic chart'2008RE039882'Ophthalmologic characteristic measuring apparatus'20077,275,823'Optometric device'20077,216,983'Ophthalmologic apparatus'20076,974,215'Optical instrument'20056,439,719'Ophthalmological apparatus'20026,409,344'Ocular refractive-power measuring device'20026,070,981'Ophthalmologic characteristic measuring apparatus'20005,886,780'Refractometer with deflecting element'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2020Patents assigned to TOPCON CORP (21)· patent assignee history
1999–2014Based in Tokyo, JP· patent location history
2011Based in Saitama, JP· patent location history
2012–2014Patents assigned to HAYASHI TAKEFUMI (6)· patent assignee history
2012Patents assigned to FUJII KOUTA (1)· patent assignee history
2014Patents assigned to SHIMIZU HITOSHI (2)· patent assignee history
2016–2019Patents assigned to KK TOPCON (6)· patent assignee history
2016–2020Based in Wako, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOPCON CORP | 21 | 1999–2020 |
| HAYASHI TAKEFUMIself | 6 | 2012–2014 |
| KK TOPCON | 6 | 2016–2019 |
| SHIMIZU HITOSHI | 2 | 2014 |
| FUJII KOUTA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 19 | 1999–2014 |
| Wako, JP | 8 | 2016–2020 |
| Saitama, JP | 1 | 2011 |