Inventor
James Karp
Inventor
Saratoga, CA, US
Overview
Patents· 60 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices17%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1017%
H01LSemiconductor devices14%
H03KPulse technique12%
G06FElectric digital data processing10%
G11CStatic stores7%
H10BElectronic memory devices5%
Y10TTechnical subjects covered by former us classification3%
G01RMeasuring electric variables2%
H02HEmergency protective circuit arrangements2%
PatentTitleYear
10,901,097Method and apparatus for electronics-harmful-radiation (EHR) measurement and monitoring202110,861,848Single event latch-up (SEL) mitigation techniques202010,811,493Single event latch-up (SEL) mitigation techniques202010,636,869Mitigation for FinFET technology using deep isolation202010,522,531Integrated circuit device and method of transmitting data in an integrated circuit device201910,497,677ESD protection in a stacked integrated circuit assembly201910,325,901Circuit for increasing the impedance of an ESD path in an input/output circuit and method of implementing the same201910,289,178Configurable single event latch-up (SEL) and electrical overvoltage stress (EOS) detection circuit201910,015,916Removal of electrostatic charges from an interposer via a ground pad thereof for die attach for formation of a stacked die20189,960,227Removal of electrostatic charges from interposer for die attachment20189,831,218Wafer to wafer stacking20179,607,948'Method and circuits for communication in multi-die packages'20179,575,111'On chip detection of electrical overstress events'20179,548,738'High voltage RC-clamp for electrostatic discharge (ESD) protection'20179,484,919'Selection of logic paths for redundancy'20169,483,599'Circuit design-specific failure in time rate for single event upsets'20169,462,674'Circuits for and methods of providing a charge device model ground path using substrate taps in an integrated circuit device'20169,406,738'Inductive structure formed using through silicon vias'20169,378,322'Preparing layouts for semiconductor circuits'20169,379,109'Integrated circuit having improved radiation immunity'20169,275,180'Programmable integrated circuit having different types of configuration memory'20169,236,353'Integrated circuit having improved radiation immunity'20169,058,454'Method and apparatus to reduce power segmentation overhead within an integrated circuit'20159,058,853'Integrated circuit having improved radiation immunity'20159,013,844'Circuit for and method of enabling the discharge of electric charge in an integrated circuit'20159,013,845'High voltage RC-clamp for electrostatic discharge (ESD) protection'20159,000,529'Reduction of single event upsets within a semiconductor integrated circuit'20158,982,581'Electro-static discharge protection for die of a multi-chip module'20158,981,491'Memory array having improved radiation immunity'20158,947,839'Enhanced immunity from electrostatic discharge'20158,881,085'Cell-level electrostatic discharge protection for an integrated circuit'20148,866,229'Semiconductor structure for an electrostatic discharge protection circuit'20148,823,133'Interposer having an inductor'20148,519,741'Operating a programmable integrated circuit with functionally equivalent configuration bitstreams'20138,453,092'T-coil network design for improved bandwidth and electrostatic discharge immunity'20138,293,547'Hybrid integrated circuit device'20128,218,277'Shared electrostatic discharge protection for integrated circuit output drivers'20128,181,140'T-coil network design for improved bandwidth and electrostatic discharge immunity'20128,174,112'Integrated circuit device with low capacitance and high thermal conductivity interface'20128,134,813'Method and apparatus to reduce footprint of ESD protection within an integrated circuit'20128,079,002'Method and apparatus for evaluating paths in an integrated circuit design'20117,947,980'Non-volatile memory cell with charge storage element and method of programming'20117,919,845'Formation of a hybrid integrated circuit device'20117,812,674'Common centroid electrostatic discharge protection for integrated circuit devices'20107,812,642'Pass gate with improved latchup immunity'20107,687,797'Three-terminal non-volatile memory element with hybrid gate dielectric'20107,544,968'Non-volatile memory cell with charge storage element and method of programming'20097,450,431'PMOS three-terminal non-volatile memory element and method of programming'20087,420,842'Method of programming a three-terminal non-volatile memory element using source-drain bias'20087,002,219'Electrical fuse for integrated circuits'20066,740,936'Ballast resistor with reduced area for ESD protection'20046,638,852'Structure and method for preventing barrier failure'20036,549,458'Non-volatile memory array using gate breakdown structures'20036,522,582'Non-volatile memory array using gate breakdown structures'20036,432,808'Method of improved bondability when using fluorinated silicon glass'20026,316,132'Structure and method for preventing barrier failure'20016,266,269'Three terminal non-volatile memory element'20016,044,012'Non-volatile memory array using gate breakdown structure in standard sub 0.35 micron CMOS process'20005,796,070'Welding gun spatter shield'19984,567,652'Burn-in board loader'1986Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1986Based in Houston, TX, US· patent location history
1998Based in New Caney, TX, US· patent location history
2000–2021Patents assigned to XILINX INC (58)· patent assignee history
2000–2021Based in Saratoga, CA, US· patent location history
2011–2017Patents assigned to KARP JAMES (19)· patent assignee history
2011–2015Patents assigned to FAKHRUDDIN MOHAMMED (5)· patent assignee history
2012–2016Patents assigned to KIREEV VASSILI (5)· patent assignee history
2013–2016Patents assigned to HART MICHAEL J (6)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| XILINX INC | 58 | 2000–2021 |
| KARP JAMESself | 19 | 2011–2017 |
| HART MICHAEL J | 6 | 2013–2016 |
| FAKHRUDDIN MOHAMMED | 5 | 2011–2015 |
| KIREEV VASSILI | 5 | 2012–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Saratoga, California, US | 58 | 2000–2021 |
| New Caney, Texas, US | 1 | 1998 |
| Houston, Texas, US | 1 | 1986 |